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Scanning Laser Induced Spectrum Surface Range Analysis and Detection System

A laser-induced, range analysis technology, applied in thermal excitation analysis, material excitation analysis, material analysis by optical means, etc., can solve the problems of easy damage of optical devices, difficult coating, poor effect, etc., to achieve compact layout, Small size structure design, mature and reliable effect of coating technology

Inactive Publication Date: 2019-08-06
ACAD OF OPTO ELECTRONICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, the induced laser energy of the system is limited to within tens of millijoules, making the optical device easy to damage
At the same time, the anti-reflection of 200 to 800nm, and the high reflectivity of devices near the wavelength of 1064nm are very difficult to coat, and the effect is poor.

Method used

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  • Scanning Laser Induced Spectrum Surface Range Analysis and Detection System
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Embodiment Construction

[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0029] As an embodiment of the present invention, see figure 1As shown, it is a schematic structural diagram of a scanning laser-induced spectral surface range analysis and detection system in an embodiment of the present invention. The scanning laser-induced spectral surface range analysis and detection system includes a focusing optical device 2, a mirror 4, and a light receiving device 5 And laser emitting head 6. Wherein, the laser emitting head 6 is connected with an external laser inducing light source, and the external laser inducing light source generates laser light, and the laser is emitted through the laser emitting head 6 to realize the occurrence of laser induced plasma. The focusing optical device 2 focuses...

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Abstract

The invention discloses a scanning laser induced spectral surface range analysis and detection system. The laser emitting head is connected with an external laser induced light source, and an external laser induced light source generates laser light, and the laser emitting head emits laser light to realize laser induced plasma. happened. The focusing optics concentrates the induced excitation laser beam emitted by the laser emitting head onto the surface of the sample to be tested. Thereafter, the mirror acquires a broad spectral range of the sample under test to induce the plasma scattered light signal to converge into the light collecting device. The light collecting device concentrates the induced plasma scattered light into the optical fiber and transmits it to an external spectrometer, and the external spectrometer splits the spectrum formed by the plasma to obtain spectral intensity data of different wavelengths. Therefore, the present invention achieves a wide range of spectral acquisitions of hundreds of nanometers with the optical axis, and can carry the Joule-level large energy laser induction with an efficiency of up to 90% or more.

Description

technical field [0001] The invention relates to the technical field of photoelectric non-destructive testing, in particular to a scanning laser-induced spectral surface range analysis and detection system. Background technique [0002] Laser-induced plasma spectroscopy (Laser Induced Plasma Spectroscopy, LIPS) detection technology is an analytical technique that uses pulsed laser ablation of substances to generate plasma, and qualitatively or quantitatively studies the composition of substances through plasma emission spectra. It has the advantages of wide application range, fast analysis speed, less destructive measurement, remote non-contact measurement and real-time detection. Laser-induced plasma spectroscopy is a quantitative analysis technique based on the emission spectrum generated by the interaction between laser and material. This method only needs a few micrograms in the measurement process, which can realize non-destructive measurement and can realize the analysi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/71
CPCG01N21/718G01N33/24G01N2201/105
Inventor 赵天卓连富强貊泽强林蔚然刘洋聂树真肖红张鸿博樊仲维
Owner ACAD OF OPTO ELECTRONICS CHINESE ACAD OF SCI
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