Integrated system and method for detecting and repairing OLED spots

A repairing method and color speckle technology, applied to instruments, static indicators, etc., can solve problems such as multi-channel picture compensation effect can not achieve the best, color shift Mura compensation ability is poor, chromaticity shift can not be evaluated, etc., to achieve Reduce the effect of panel current limitation, good compensation effect, and shorten the test cycle

Active Publication Date: 2018-10-19
WUHAN JINGCE ELECTRONICS GRP CO LTD
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Problems solved by technology

[0006] A. It takes a long time. Taking R / G / B each with 6 gray-scale images as an example, a total of 18 images need to be shot, and the low gray-scale brightness and low exposure time are longer;
[0007] B. Due to the current limitation of the OLED drive circuit, the current of a single-channel screen (R / G / B screen) and the current of a multi-channel screen (such as a white screen) are not simply superimposed or linear, and the R / G / B screen The IRDROP may be different from the IRDROP of the white picture, and the single-color picture can be compensated better by extracting the brightness for compensation alone, but the compensation effect of the compensation data for the multi-channel picture cannot be optimal;
[0008] C. Due to the existence of current limitation, the sum of the current values ​​of the RGB monochrome screen is greater than the current of the white screen, and the compensation of the monochrome screen cannot be equal to the compensation of the white screen, so the compensation ability for the color shift type Mura is poor, and it is impossible to evaluate before and after compensation. Chromaticity shift of

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  • Integrated system and method for detecting and repairing OLED spots

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[0041]In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0042] An embodiment of the OLED stain detection and repair integrated system provided by the present invention, its system refers to figure 1 , including a calculation unit, an optical measurement unit and a drive unit;

[0043] Among them, the optical measurement unit is connected with the calculation unit, and the driving unit acts on the OLED panel to be tested, and is used to drive the pane...

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Abstract

The invention, which belongs to the technical field of panel detection, discloses an integrated system and method for detecting and repairing OLED spots. The system is composed of a calculation unit,an optical measurement unit and a driving unit. The driving unit is applied to a pane and is used for driving the panel to lightening white pictures with different gray scales. The optical measurementunit is used for shooting pixel brightness measurement pictures and chromaticity measurement pictures of the panel under white pictures after being triggered by the driving unit. The calculation unitis used for acquiring brightness values and chromaticity values of all pixels based on the brightness measurement pictures and chromaticity measurement pictures and determining spot types and levels;compensation data of R / G / B channels are calculated based on the brightness values and chromaticity values of all gray scales and the compensation data are transformed into ones in formats that can bereceived by the driving chip of the panel, and the transformed data are sent to a memory of the panel; the compensation data in the memory are invoked to carry out spot repairing on a to-be-repairedpanel under control of a demura enabling state register. According to the invention, the two-third test time is reduced; the efficiency of the spot detection and compensation work is improved; and thebrightness uniformity of the white picture is compensated well.

Description

technical field [0001] The invention belongs to the field of display technology, and more specifically relates to an integrated system and method for detecting and repairing OLED stains. Background technique [0002] Due to the limitations of the crystallization process, low-temperature polysilicon thin-film transistors (LTPS TFTs) fabricated on large-area glass substrates often have non-uniformity in electrical parameters such as threshold voltage and mobility. , this non-uniformity will be converted into current difference and brightness difference of OLED display device, and be perceived by human eyes, that is, mura (color spot) phenomenon. The mura repair technology is a technology that eliminates the mura phenomenon of the display and makes the brightness of the screen uniform. [0003] In the prior art, for example, a method for eliminating the Mura of an OLED display panel disclosed in Chinese patent application number 201610200089.5 first selects the corresponding c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G09G3/00G09G3/3208
CPCG09G3/006G09G3/3208G09G2320/0626
Inventor 冯晓帆郑增强刘钊马尔威吴红君刘荣华沈亚非
Owner WUHAN JINGCE ELECTRONICS GRP CO LTD
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