A method for consistent output of cmos detectors with different frame rates and the same integration time
An integration time and detector technology, which is applied in the field of photoelectric detection, can solve the problems that CMOS detectors cannot always integrate and the output is inconsistent.
Active Publication Date: 2020-04-10
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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[0005] Aiming at the problem that the output of the existing CMOS detectors is inconsistent at different frame rates and within the same integration time and the problem that the CMOS detectors cannot always integrate in the entire frame period, the embodiment of the present invention proposes a method to ensure that the CMOS detectors Consistent method output at different frame rates with the same integration time
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[0023] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.
[0024] The terms "first", "second", "third", "fourth", etc. (if any) in the description and claims of the present invention and the above drawings are used to distinguish similar objects, and not necessarily Used to describe a specific sequence or sequence. It is to be understood that the terms so used are interchangeable under app...
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The embodiment of the present invention discloses a method for ensuring consistent output of a CMOS detector under the same integration time at different frame frequencies. The method includes dividing the integration time of the CMOS detector into a first type of integration time and a second type of integration time according to the camera frame period and the readout time of a frame of pixels according to the actual working conditions; the integration time belongs to the first type of integration time. The CMOS detectors work in the preset first state sequence; for the CMOS detectors whose integration time belongs to the second type of integration time, the CMOS detectors work in the preset second state sequence, and the second state The order is different from the first state order. In this method, for the case of short integration time, one frame of image is read out immediately after integration, so that the output will not be affected by parasitic light; for the case of long integration time, the readout time of one frame of pixels is divided into two parts , effectively ensuring that the integration time is continuously adjustable within the frame period range to achieve consistent output.
Description
technical field [0001] The invention relates to the technical field of photoelectric detection, in particular to a method for ensuring consistent output of a CMOS detector under the condition of different frame frequencies and the same integration time. Background technique [0002] In most imaging systems based on CMOS detectors, in order to increase the incident energy and frame rate of the imaging system, the frame period (ie the reciprocal of the frame rate) is defined as the integration time. If the brightness of the observed scene is high, the integration time needs to be reduced. At present, it is usually done by increasing the frame rate. [0003] For airborne imaging spectroscopy instruments, when the spatial resolution index along the track is determined, the flight speed of the aircraft determines the working frame rate of the CMOS detector. The flight speed is usually constant and will not change in real time according to the brightness of the ground objects. T...
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IPC IPC(8): H04N5/225H04N5/353H04N5/374H04N5/378
CPCH04N23/54H04N25/53H04N25/76H04N25/75
Inventor 张航李帅刘栋斌
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI