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Comprehensive Identification Model, Method and Application of Wheat Shade Tolerance

An identification method and shade tolerance technology, applied in the field of wheat shade tolerance comprehensive identification model, can solve the problem of low accuracy of wheat shade tolerance evaluation method

Active Publication Date: 2022-05-20
INST OF GRAIN CROPS XINJIANG ACAD OF AGRICLTURE SCI
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Problems solved by technology

[0004] In view of this, the embodiment of the present invention provides a comprehensive identification model, method and application of wheat shade tolerance, the main purpose of which is to solve the problem of low accuracy of the evaluation method of wheat shade tolerance

Method used

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  • Comprehensive Identification Model, Method and Application of Wheat Shade Tolerance
  • Comprehensive Identification Model, Method and Application of Wheat Shade Tolerance
  • Comprehensive Identification Model, Method and Application of Wheat Shade Tolerance

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Embodiment

[0028] This test was carried out in Xinjiang wheat breeder Zepu Base in 2017; the test materials were 20 wheat varieties with different shade tolerance screened out according to the previous yield results (see Table 1); the light treatment was set as low light and natural light control Two treatments; 3 replicates were set up in the experiment, and the sowing area of ​​each replicate was 1m 2 , the row spacing is 20cm, the test material was sown on October 15, 2016, and the shading net was built on April 15, 2017 when the winter wheat was in the jointing stage, with a shading rate of 70%. During the test period, the relevant traits were measured; the cultivation water quality and management measures of each treatment were consistent during the test period.

[0029] Table 1 Test materials

[0030]

[0031]

[0032] Different letters indicate significant differences at the p<0.05 level; S / C indicates the ratio of weak light to natural light.

[0033] During the filling p...

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Abstract

The invention discloses a wheat shade tolerance comprehensive identification model, method and application, and relates to the field of agricultural planting. The identification model is: D=-1.049+0.357Tr+0.485MSW+0.756PL+0.179SLA+0.206WDW; Tr is the transpiration rate of wheat leaves, unit mmol m ‑2 ·s ‑1 ; MSW is the grain weight of the main ear of wheat, in g; PL is the ear length of wheat, in cm; SLA is the specific leaf area of ​​wheat, in cm 2 / g; WDW is the dry weight of wheat spikes, in g; the larger the value of D, the stronger the shade tolerance of the wheat. The identification model of the present invention can be used for winter wheat shade tolerance evaluation, can measure above-mentioned 5 indexes of other winter wheat varieties under the same conditions, obtain its shade tolerance coefficient, and utilize this model to obtain shade tolerance comprehensive evaluation value D, can Scientifically and effectively predicting the shade tolerance of different winter wheat varieties.

Description

technical field [0001] The invention relates to the technical field of agricultural planting, in particular to a comprehensive identification model, method and application of wheat shade tolerance. Background technique [0002] Plant shade tolerance identification indicators are closely related to plant genetic factors and external environment, and as many indicators as possible should be used for comprehensive evaluation. The relative value of the index can more accurately reflect the shade tolerance of plants than the absolute value. For the evaluation of soybean shade tolerance, there have been related studies. Chen Huaizhu et al. have selected the biomass at pod setting stage, plant height at harvest time, minimum pod height, number of pods per plant, Grain number per plant, grain weight per plant and 100-grain weight are index traits, and the shade tolerance coefficients of the index traits are added up, and the average value is obtained to obtain the comprehensive sha...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06Q10/04G06Q10/06G06Q50/02A01G22/20
CPCA01G22/20G06Q10/04G06Q10/0639G06Q50/02
Inventor 方辉张永强范贵强高永红黄天荣周安定曹俊梅王仙刘联正刘娜哈力旦·依克热木聂石辉曾潮武梁晓东刘恩良陈传信吴新元张新忠李建疆金平芦静路子峰雷钧杰高海峰谢小清毛红艳
Owner INST OF GRAIN CROPS XINJIANG ACAD OF AGRICLTURE SCI
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