Superconducting tape current uniformity testing device and calibration method

A current uniformity, superconducting tape technology, applied in the field of superconductivity, can solve the problems of high critical current fluctuation frequency, mechanical damage of superconducting tape, loss of critical current distribution data, etc., to simplify time-consuming and human resource costs , Improve the test efficiency, the effect of high test efficiency

Active Publication Date: 2021-06-11
SHANGHAI SUPERCONDUCTOR TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

1. In the test, the current lead and the voltage lead need to be in contact with the strip, which will cause mechanical damage to the superconducting strip. 2. Secondly, the test efficiency is also very low. Although some scientific research institutions have invented such as the long-band critical Current test device, but the actual test of the product is of little significance, because the speed of testing based on this device is much lower than the speed of strip production
3. The fixed step length (usually 0.5m-4m) tests the critical current performance distribution of the superconducting strip, and the critical current distribution data within this step length will be lost
4. The contact test has certain requirements on the overcurrent characteristics of the strip, so it can only test part of the copper-plated or packaged strip. For the silver-plated superconducting strip, the copper-plated thinner superconducting strip or There is a high probability that the superconducting tape packaged in stainless steel will be burned because the tape cannot withstand the overcurrent at the contact point.
Therefore, it is very difficult to use this figure to measure the critical current distribution of the entire strip measured by the per unit magnetic measurement method.
Using the method of taking the average value of multiple measurements, firstly, it wastes materials and time, and secondly, it may not be completely accurate. The reason is that the fluctuation frequency of the critical current is very high.
If the mark is inaccurate, there will be problems in judging the low point of superconducting tape, which will greatly affect the use of superconducting tape and hinder the advancement of superconducting applications

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  • Superconducting tape current uniformity testing device and calibration method
  • Superconducting tape current uniformity testing device and calibration method
  • Superconducting tape current uniformity testing device and calibration method

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Embodiment Construction

[0057] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several changes and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.

[0058] A kind of superconducting tape electric current uniformity testing device provided according to the present invention is used for testing the electric current uniformity of superconducting tape 4, comprises critical current test frame 1, conductive sheet 3 and voltage lead probe 6; The sheet 3 is coated on both ends of the critical current test frame 1; the two ends of the superconducting tape 4 are respectively electrically connected to the conductive sheet 3 arranged at the two ends of the curre...

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Abstract

The invention provides a superconducting tape current uniformity test device and calibration method, wherein the test device is used to test the current uniformity of the superconducting tape (4), including a critical current test frame (1), a conductive sheet (3 ) and voltage lead probes (6); the conductive sheet (3) is coated on both ends of the critical current test frame (1); the two ends of the superconducting tape (4) are respectively arranged on the current test frame (1 ) are electrically connected to the conductive sheets (3) at both ends; one end of the voltage lead probe (6) is crimped on the surface of the superconducting strip (4). The device provided by the invention has the advantages of simple structure, low cost and high test efficiency, and can easily and quickly realize the test of the critical current distribution on the short sample of the strip without destroying the superconducting strip; the method provided by the present invention is compatible with The magnetic measurement method has an excellent corresponding degree, which effectively improves the test efficiency and simplifies the time-consuming and human resource costs of the test process.

Description

technical field [0001] The invention relates to the field of superconducting technology, in particular to a testing device and a calibration method for the current uniformity of a superconducting strip. Background technique [0002] Since the first discovery of superconductivity in the laboratory by Professor Camerin Onners of Leiden University in the Netherlands in 1911, superconducting materials and their applications have been one of the most active frontier research fields in contemporary science and technology. In January 1986, scientists Bernoz and Müller, who worked in the laboratory of International Business Machines Corporation in Zurich, Switzerland, first discovered that barium lanthanum copper oxide was a high-temperature superconductor, and soon within 1-2 years, the superconductor The critical transition temperature of , has been raised above the temperature of liquid nitrogen by various research groups around the world, thus eliminating the need for expensive ...

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G01R33/12
Inventor朱佳敏赵跃陈思侃甄水亮丁逸珺夏慧能陈永春连亚博洪智勇
OwnerSHANGHAI SUPERCONDUCTOR TECH CO LTD