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Space target imaging simulation surface element blanking method

A space target and surface element technology, applied in radio wave measurement systems, instruments, etc., can solve the problems of long time and low efficiency, and achieve the effect of reducing the number of times, reducing time consumption, and high-precision and fast occlusion judgment

Active Publication Date: 2019-08-06
HARBIN INST OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the problem of long time and low efficiency in the method of judging the occlusion of the facets by using the mutual traversal method of all the facets under the condition of a large number of micro-facets

Method used

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  • Space target imaging simulation surface element blanking method
  • Space target imaging simulation surface element blanking method
  • Space target imaging simulation surface element blanking method

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specific Embodiment approach 1

[0021] Specific implementation mode one, combining figure 1 This embodiment will be described.

[0022] A method for blanking a space target imaging simulation panel according to the present embodiment, the method includes the following steps:

[0023] Step 1: Determine the visibility of the surface element to the sun light source. Assuming that the space object is in the world coordinate system, taking the triangular surface element as an example, the coordinates of the three vertices of the Nth grid of the space object in the world coordinate system are P N1 (X N1 ,Y N1 ,Z N1 ), P N2 (X N2 ,Y N2 ,Z N2 ) and P N3 (X N3 ,Y N3 ,Z N3 ), the coordinates of the center point of the surfel are C N (X N ,Y N ,Z N ).

[0024] The direction of the sun’s rays in the world coordinate system is S=(X S ,Y S ,Z S ), the P N1 ,P N2 ,P N3 and C N Parallel projection along the direction of the sun's rays to the projection plane perpendicular to the optical axis, that is...

Embodiment

[0043] Carry out simulation experiments according to specific implementation methods, taking the space object shown in Figure 2(a) as an example, the bin division is about 4.89×10 5 One, take M=40, then the occlusion judgment method based on mutual traversal of all target surfels takes about 80 hours; the time consumption of the method proposed by the present invention is about 5 seconds. Fig. 2(b) is the simulation imaging result of Fig. 2(a) using the present invention.

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Abstract

A space target imaging simulation surface element blanking method belongs to the target imaging simulation technology field. The method for judging surface element shielding by using a mutual traversal method of all surface elements under a large number of micro surface element conditions has disadvantages that consumed time is long and efficiency is low. The method of the invention is used to solve the above problems. The space target imaging simulation surface element blanking method comprises a blanking part of a sun light source by surface elements and a camera blanking part. The blankingpart of the sun light source by the surface elements refers to determination of whether each micro surface element of a space target surface can receive sun light. The camera blanking part by the surface elements refers to the determination of visibility of each micro surface element of a spatial target to a camera. A visible surface element to the sun light source and the visible surface elementto the camera are intersected to obtain a surface element set which is visible to the sun light source and the camera. The method is suitable for space target imaging simulation surface element blanking.

Description

technical field [0001] The invention relates to a surface element blanking method for space target imaging simulation, and belongs to the technical field of target imaging simulation. Background technique [0002] In space target imaging simulation, the target surface is usually divided into tiny triangular / four-corner facets, and the distribution of solar energy reflected by each facet on the imaging focal plane is judged separately, so as to obtain a target simulation image based on radiation transfer . In this process, it is necessary to judge the visibility of all micro-facets to the sun light source and camera, so as to remove the influence of occlusion facets on imaging. [0003] Generally, the method of judging surfel occlusion is to traverse all the surfels of the target. This method is accurate in calculation, but requires a large amount of computation. Due to the complex structure of the surface of the space target, the surface is rough and undulating. In order t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S7/48
CPCG01S7/4804
Inventor 汪洪源颜志强王秉文刘祥康文李崇远陈伟胡海泉武少冲王蓝玉曹尧尧
Owner HARBIN INST OF TECH
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