Method and device for aging test of intelligent equipment

A smart device and aging test technology, applied in the computer field, can solve the problem that the test time cannot be adjusted

Active Publication Date: 2021-11-02
SHANGHAI LONGCHEER TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] One purpose of this application is to provide a method and equipment for smart device aging testing, which solves the problem that the functional stability test and aging test of smart devices in the prior art use fixed test items and fixed test sequences for testing, and the test time cannot be adjusted. question

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  • Method and device for aging test of intelligent equipment
  • Method and device for aging test of intelligent equipment
  • Method and device for aging test of intelligent equipment

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Embodiment Construction

[0060] The application will be described in further detail below in conjunction with the accompanying drawings.

[0061] In a typical configuration of the present application, the terminal, the device serving the network and the trusted party all include one or more processors (CPUs), input / output interfaces, network interfaces and memory.

[0062] Memory may include non-permanent storage in computer readable media, in the form of random access memory (RAM) and / or nonvolatile memory such as read only memory (ROM) or flash RAM. Memory is an example of computer readable media.

[0063] Computer-readable media, including both permanent and non-permanent, removable and non-removable media, can be implemented by any method or technology for storage of information. Information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random acce...

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Abstract

The purpose of this application is to provide a method and equipment for aging testing of smart devices, wherein the method includes: obtaining a confirmation instruction from the user for the test mode, and determining the test mode to be used according to the confirmation instruction of the test mode, wherein the The test mode used above includes a developer mode and a non-developer mode; determine the target test item of the smart device according to the test mode used, and test the target test item of the smart device; record and store the test process According to the data information, the test results are counted and displayed, wherein the data information includes the cause of the test failure and the time when the test failure occurred, and counts the number of successful test rounds and the number of test failure rounds. Therefore, in the functional stability test and aging test of smart devices, smart devices with different configurations can be customized and adapted. Compared with the existing technology, all items that need to be tested can be covered in a shorter time and sufficient test pressure can be achieved.

Description

technical field [0001] The present application relates to the field of computers, in particular to a method and equipment for aging testing of intelligent equipment. Background technique [0002] In the production process of smart devices, it is a very important step to perform aging tests and functional stability tests on devices, and it has very important practical significance for the quality monitoring of smart devices. In the existing technology, the functional stability test and aging test of smart devices are usually tested with fixed test items and fixed test sequences, and the test time is not adjustable. When such a test scheme is applied to different smart device systems for testing It is time-consuming and labor-intensive to design and test the process individually for each system. Contents of the invention [0003] One purpose of this application is to provide a method and equipment for smart device aging testing, which solves the problem that the functional ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 邱永伟孟旭杜军红汤肖迅
Owner SHANGHAI LONGCHEER TECH CO LTD
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