Unlock instant, AI-driven research and patent intelligence for your innovation.

Array substrate and long film repairing method

An array substrate and array technology, applied to electrical components, electrical solid devices, circuits, etc., can solve problems such as abnormality of adjacent pixel units

Inactive Publication Date: 2020-06-23
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The invention provides an array substrate and a long-film repair method, which are used to solve the technical problem of abnormality of adjacent pixel units in defect regions in existing long-film repair methods

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Array substrate and long film repairing method
  • Array substrate and long film repairing method
  • Array substrate and long film repairing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] The following descriptions of the various embodiments refer to the accompanying drawings to illustrate specific embodiments in which the invention may be practiced. The directional terms mentioned in the present invention, such as [top], [bottom], [front], [back], [left], [right], [inside], [outside], [side], etc., are only for reference The orientation of the attached schema. Therefore, the directional terms used are used to illustrate and understand the present invention, but not to limit the present invention. In the figures, structurally similar elements are denoted by the same reference numerals.

[0033] Aiming at the technical problem of the abnormality of the adjacent pixel units in the defective region in the existing long film repair method, the embodiments of the present invention can solve this problem.

[0034] Such as figure 1 , figure 2 as shown, figure 2 It is a schematic diagram of the cross-sectional film layer of the pixel unit 20, showing the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an array substrate and a long film repairing method. The array substrate comprises a substrate body, pixel units arranged in an array mode, data lines and a repairing film layer, the pixel units comprise through holes, the data lines comprise defect areas, the repairing film layer covers the defect areas, the repairing film layer is provided with at least one partition, andthe data lines and the pixel units are disconnected through the partitions; and a partition is arranged on the repairing film layer, so that a conductive path for transmitting a data signal to the pixel unit is blocked.

Description

technical field [0001] The invention relates to the technical field of metal wire repair, in particular to an array substrate and a long film repair method. Background technique [0002] During the metal wire film forming process of the array substrate process, the metal wire is easy to form defect areas, resulting in abnormal occurrences such as vertical broken lines or dark lines. The existing technology can effectively reduce the defect area through the long film repair method, but in the process of long film repair Among them, at the starting point of the long film, the tungsten layer formed by sputtering is easy to connect the data line at the conduction defect area and the adjacent pixel unit, causing the data signal to be transmitted to the pixel unit, causing the pixel unit to be abnormal. Therefore, the existing long The film repair method has the technical problem that the adjacent pixel units in the defect area are abnormal. Contents of the invention [0003] T...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L27/12H01L21/84
CPCH01L27/1244H01L27/1218H01L27/1262
Inventor 胡凯谢克成刘泽钦
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD