Unlock instant, AI-driven research and patent intelligence for your innovation.

Array substrate and display panel

A technology for array substrates and display panels, applied in instruments, nonlinear optics, optics, etc., can solve problems such as the inability to accurately monitor the actual width of each color-resisting strip

Active Publication Date: 2021-07-06
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The embodiment of the present application provides an array substrate and a display panel to solve the technical problem that the existing display panel measures the width of each color resistance by measuring the testkey, so that the actual width of each color resistance bar cannot be accurately monitored

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Array substrate and display panel
  • Array substrate and display panel
  • Array substrate and display panel

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Apparently, the described embodiments are only some of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without making creative efforts belong to the scope of protection of this application.

[0037] In the description of the present application, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", " Orientation indicated by rear, left, right, vertical, horizontal, top, bottom, inside, outside, clockwise, counterclockwise, etc. The positional relationship is based on the orientation or positional relationship shown in the drawings, which is only for the convenience of describing the a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present application provides an array substrate and a display panel. The array substrate includes a base, data lines and color resists. In the present application, the bending unit is arranged on the data line so that the edge of the color resistance covering the bending unit does not overlap with the data line, and thus it is convenient for an external device to monitor the actual width of the color resistance covering the bending unit.

Description

technical field [0001] The present application relates to the field of display technology, in particular to an array substrate and a display panel. Background technique [0002] In COA (Color Filter on Array, the color filter substrate is integrated on the array substrate) liquid crystal products, because the red / green / blue resist strips will overlap with the edges of the data lines under the color resist strips after all the fabrication is completed, resulting in the When performing line width measurement, the actual line width cannot be measured. [0003] In the prior art, the width of each color-resisting strip is monitored by setting a testkey (test unit) at the end of each color-resisting strip and monitoring the width of the testkey. However, the width of each color-resisting strip obtained by measuring the width of the testkey will be different from the actual width of each color-resisting strip, so that the actual width of each color-resisting strip cannot be accura...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/1335G02F1/1362
CPCG02F1/133514G02F1/136286G02F1/136222
Inventor 罗平
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD