A memory failure detection method, device, electronic device and readable storage medium

Abstract

The present application discloses a memory fault detection method, device, electronic device and computer-readable storage medium. The method includes: acquiring a target log; the target log is a register log and / or a sensor log; performing a keyword-based memory on the target log Fault detection; if a memory fault is detected, the target log is used to obtain the corresponding memory information and fault information; the register is used to interact with the memory, and the register log is used to record the working status of the register; the sensor is used to show the working status of each hardware, The working state of the memory will be recorded, so the register log and sensor log can be used for fault detection; this method can call the target log and perform keyword matching, and the fault can be detected when the memory is not completely damaged and only part of the address fails. detection, improve the fault detection ability.

Description

technical field [0001] The present application relates to the technical field of fault detection, and in particular, to a memory fault detection method, a memory fault detection device, an electronic device, and a computer-readable storage medium. Background technique [0002] Memory is one of the most frequently used hardware in electronic equipment such as servers and computers. Due to frequent IO and power-on and power-off, it is inevitable that some faults such as Single Bit Fault (single-bit fault) and Row Fault (row fault) will appear in the memory. These failures will not cause the memory to be directly unusable, that is, the memory can continue to be used after the above-mentioned failures, but these failures will cause the performance of the memory to degrade and eventually lead to damage to the memory, resulting in loss of data or downtime of electronic equipment. The related art can only detect memory damage after the memory is completely damaged, but cannot detec...

AI Technical Summary

Problems solved by technology

These failures will not cause the memory to be directly unusable, that is, the memory can still be used after the above failures occur, but these failures will cause memory performance to degrade, and eventually lead to memory damage, resulting in data loss or electronic equipment downtime

Related technologies can only detect memory damage after the memory is completely damaged, but cannot detect the above-mentioned faults, and the fault detection capability is weak

[0003] Therefore, the problem of weak fault detection capability in related technologies is a technical problem to be solved by those skilled in the art

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