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365 results about "Memory performance" patented technology

Memory performance information is available from the memory manager through the system performance counters and through functions such as GetPerformanceInfo, GetProcessMemoryInfo, and GlobalMemoryStatusEx.

Nonvolatile semiconductor memory device having excellent charge retention and manufacturing process of the same

There has been a problem in conventional Si-type floating-gate type nonvolatile semiconductor memory devices that the charge retention characteristic is low due to insufficiently large electron affinity of Si, therefore improvement of the memory performances, such as scaling down of a memory cell and increasing operation speed, have been difficult to be achieved due to the essential problem. In order to solve the above problem, in the nonvolatile semiconductor memory device of the present invention, a material having large work function or large electron affinity or a material having a work function close to that of semiconductor substrate or of a control gate, is employed for a floating gate retaining charges. Further, an amorphous material having small electron affinity for an insulating matrix is used. Further, at a time of deposition of charge retention layer, the supply ratio of the nano-particle material and the insulating matrix material, such as the mixture ratio of materials of both phases in a target in a sputtering method, is adjusted. By these methods, the charge retention characteristic of the floating-gate type nonvolatile semiconductor memory device can be improved, and the above-mentioned problem of the nonvolatile semiconductor memory device can be solved.
Owner:ASAHI GLASS CO LTD +1

Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices

In one embodiment of the present invention, a memory storage system for storing information organized in sectors within a nonvolatile memory bank is disclosed. The memory bank is defined by sector storage locations spanning across one or more rows of a nonvolatile memory device, each the sector including a user data portion and an overhead portion. The sectors being organized into blocks with each sector identified by a host provided logical block address (LBA). Each block is identified by a modified LBA derived from the host-provided LBA and said virtual PBA, said host-provided LBA being received by the storage device from the host for identifying a sector of information to be accessed, the actual PBA developed by said storage device for identifying a free location within said memory bank wherein said accessed sector is to be stored. The storage system includes a memory controller coupled to the host; and a nonvolatile memory bank coupled to the memory controller via a memory bus, the memory bank being included in a non-volatile semiconductor memory unit, the memory bank has storage blocks each of which includes a first row-portion located in said memory unit, and a corresponding second row-portion located in each of the memory unit, each of the memory row-portions provides storage space for two of said sectors, wherein the speed of performing write operations is increased by writing sector information to the memory unit simultaneously.
Owner:MICRON TECH INC

Defect gradient to boost nonvolatile memory performance

Embodiments of the present invention generally relate to a resistive switching nonvolatile memory element that is formed in a resistive switching memory device that may be used in a memory array to store digital data. The memory element is generally constructed as a metal-insulator-metal stack. The resistive switching portion of the memory element includes a getter portion and/or a defect portion. In general, the getter portion is an area of the memory element that is used to help form, during the resistive switching memory device's fabrication process, a region of the resistive switching layer that has a greater number of vacancies or defects as compared to the remainder of resistive switching layer. The defect portion is an area of the memory element that has a greater number of vacancies or defects as compared to the remainder of the resistive switching layer, and is formed during the resistive switching memory device's fabrication process. The addition of the getter or defect portions in a formed memory device generally improves the reliability of the resistive switching memory device, improves the switching characteristics of the formed memory device and can eliminate or reduce the need for the time consuming additional post fabrication “burn-in” or pre-programming steps.
Owner:KIOXIA CORP +1

Preparation method of novel polymer-based multilayer shape memory material

The invention discloses a preparation method of a novel polymer-based multilayer shape memory material. The multilayer shape memory material prepared through the preparation method is formed by a polymer-based fixed phase layer and a polymer-based revertible phase layer, and has a two phase alternate multilayer bicontinuous structure, wherein the polymer-based fixed phase layer is a polymer having rubber elasticity at room temperature, and the polymer-based revertible phase layer is a polymer having obvious melt transition or glass transition in the heating process. The multilayer material deforms at a melting point or a glass transition temperature or above, then is cooled to room temperature in order to obtain a temporary shape, and then is heated to the melting point or the glass transition temperature or above in order to recover to an initial shape. The polymer-based multilayer shape memory material prepared through the preparation method has the advantages of controllable layer quantity, layer thickness and layer structure, adjustable raw material formula, excellent shape memory performance, commercial raw materials, and low production cost; and the preparation method has the advantages of simplicity, high production efficiency, and realization of continuous batch production.
Owner:SICHUAN UNIV
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