Efficient method and computer program for modeling and improving static memory performance across process variations and environmental conditions

a static memory and environmental condition technology, applied in probabilistic cad, digital storage, instruments, etc., can solve the problems of critical limitations, predicted to become even more critical limitations, and increasingly subject to variability, so as to increase the yield of devices, reduce processing power requirements, and increase analysis speed
US20060203581A1Inactive Publication Date: 2006-09-14GLOBALFOUNDRIES INC
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Patent Information

Authority / Receiving Office
US · United States
Patent Type
Applications(United States)
Current Assignee / Owner
GLOBALFOUNDRIES INC
Publication Date
2006-09-14
Estimated Expiration
Not applicable · inactive patent

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Abstract

An efficient method and computer program for modeling and improving stating memory performance across process variations and environmental conditions provides a mechanism for raising the performance of memory arrays beyond present levels / yields. Statistical (Monte-Carlo) analyses of subsets of circuit parameters are performed for each of several memory performance variables and then sensitivities of each performance variable to 15 each of the circuit parameters are determined. The memory cell design parameters and / or operating conditions of the memory cells are then adjusted in conformity with the sensitivities, resulting in improved memory yield and / or performance. Once a performance level is attained, the sensitivities can then be used to alter the probability distributions of the performance variables to achieve a higher yield. Multiple cell designs can be compared for performance, yield and sensitivity of performance variables to circuit parameters over particular environmental conditions in order to select the best cell design.
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Description

BACKGROUND OF THE INVENTION

[0001] 1. Technical Field

[0002] The present invention relates generally to memory circuit design methodologies and programs for designing digital memory circuits, and more particularly to a method and computer program for improving static memory performance across process variations and environmental conditions.

[0003] 2. Description of the Related Art

[0004] Memory speed and other performance factors are critical limitations in today's processing systems and are predicted to become even more of a critical limitation as technologies move forward. In particular, static random access memories (SRAMS) and memory cells are used in processor caches, registers and in some designs external to the system processors for fast access to data and program instructions.

[0005] With processor cycle frequencies reaching well above 4 Ghz, development of SRAM cells that can store and provide access to stored values within that period has become necessary. However, at proc...

Claims

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