Method and device for measuring track of atomic group in atomic interferometer
Patent Information
- Authority / Receiving Office
- CN Β· China
- Current Assignee / Owner
- INNOVATION ACAD FOR PRECISION MEASUREMENT SCI & TECH CAS
- Publication Date
- 2021-03-12
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Abstract
Description
technical field
[0001] The invention relates to the technical field of cold atom interference, more specifically to a method for measuring the track of atomic groups in an atomic interferometer, and also to a device for measuring the track of atomic groups in the atomic interferometer. The invention is applicable to the field of atomic interferometer quantum sensing, and can also be used to improve the measurement accuracy of quantum sensing devices based on atomic interferometer. Background technique
[0002] In a double-loop atomic interferometer or a two-component differential atomic interferometer, in order to obtain a common mode effect, the trajectories of the two groups of alkali metal atomic groups being manipulated should coincide, which can eliminate the common noise effects, such as stray magnetic fields, vibrations, Wavefront et al. Therefore, the precise measurement and calibration of atomic group trajectories in atomic interferometers is one of the most import...