Anomaly detection method and device

An anomaly detection and to-be-detected technology, applied in the field of target detection, can solve the problems of small scope of application, large consumption of computing resources, large amount of training data, etc., and achieve the effect of wide application scope.
CN112508950BActive Publication Date: 2021-05-11CHANGZHOU MICROINTELLIGENCE CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
CHANGZHOU MICROINTELLIGENCE CO LTD
Publication Date
2021-05-11

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Abstract

The present invention provides a method and device for abnormality detection. The method includes the following steps: acquiring a target detection image of a workpiece to be detected and a good product image of a good product; acquiring a first feature map according to the target detection image, and obtaining a second Feature map; obtain the cosine similarity according to the first feature map and the second feature map; perform the first abnormality detection on the workpiece to be detected according to the cosine similarity; if it is impossible to judge whether the workpiece to be detected is abnormal, then obtain the first Grayscale image, and obtain the second grayscale image according to the good product image; obtain the first segmentation image according to the first grayscale image, and obtain the second segmentation image according to the second grayscale image; obtain the second segmentation image according to the first segmentation image and the second segmentation image Obtain the index score; perform a second anomaly detection on the workpiece to be detected according to the index score. The invention can accurately detect the abnormality of the workpiece to be detected, has a wide application range, and does not need to consume a lot of manpower, material resources and time costs.
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Description

technical field

[0001] The invention relates to the technical field of target detection, in particular to an abnormality detection method and an abnormality detection device. Background technique

[0002] In the field of industrial quality inspection, abnormal detection of defects is a key link. Compared with ordinary defects, the number of abnormal defects is small, and there is also a large gap in shape between abnormal defects and ordinary defects, such as: severe distortion of shape, large area of ​​material shortage, etc. Due to the extremely small number of samples of abnormal defects, this type of defects cannot be learned by the target detection model.

[0003] In related technologies, operators of open source libraries such as OpenCV, or GAN (Generative Adversarial Networks, generative confrontation network) networks, or deep learning algorithms are generally used to achieve anomaly detection. However, the above technologies have the following problems: (1) Using O...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
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