Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Student comprehensive evaluation method and system

A comprehensive evaluation and student technology, applied in the field of teaching informatization, can solve problems such as waste of manpower and material resources, data security impact, analysis and processing, etc., to achieve the effect of promoting normalized collection, solving the difficulty of correlation and comparison, and ensuring reliability

Pending Publication Date: 2021-05-11
上海光数信息科技有限公司
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In addition, the reliability of evaluation data is particularly important for future comprehensive evaluation of students. Collecting wrong data will lead to failure of subsequent analysis and processing, and the human and material resources invested in early data collection are also a great waste.
Data modification and deletion due to wrong data is also an impact on data security

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Student comprehensive evaluation method and system
  • Student comprehensive evaluation method and system
  • Student comprehensive evaluation method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044] The following describes several preferred embodiments of the present invention with reference to the accompanying drawings, so as to make the technical content clearer and easier to understand. The present invention can be embodied in many different forms of embodiments, and the protection scope of the present invention is not limited to the embodiments mentioned herein.

[0045] In the following specific embodiments, the evaluation index refers to an index that guides the generation of evaluation data. Evaluation data refers to the actual data collected by users based on evaluation indicators, such as student test scores, moral education results, class performance, etc., which are data generated regularly on a daily basis, or data collected according to specific situations.

[0046] One aspect of the present invention provides a kind of student comprehensive evaluation system, in one embodiment, this student comprehensive evaluation system comprises system configuratio...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a student comprehensive evaluation system, and the system comprises a system configuration module which is used for configuring evaluation indexes, identity information, evaluation levels and an association relationship thereof; a data processing module, which is used for processing evaluation data collected according to the evaluation indexes into structured data; and a data reliability judgment module, which is connected with the data processing module, can interact with a user side and is used for judging whether the data to be stored in the data storage module conforms to a system configuration rule or not. The invention also discloses a student comprehensive evaluation method. The method comprises the following steps: carrying out system configuration; calling indexes; collecting data; processing data; judging data reliability; and storing data. According to the system and the method, evaluation data can be converted into structured data, and normalized collection of student evaluation data, statistical analysis of data at different evaluation levels and guarantee of data reliability are realized.

Description

technical field [0001] The invention relates to the field of teaching informatization, in particular to a comprehensive evaluation method and system for students. Background technique [0002] The traditional form of education and teaching is mainly based on exams. The current teaching reform requires that the assessment methods of students and school education work be shifted to a more diverse and personalized way to reflect the comprehensive quality of students. Therefore, new forms of assessment tools need to be established. [0003] Really effective evaluation data requires normalized real data collection that can be managed and measured in a unified manner, which brings about contradictions between the unified management indicators of the education authorities and the campus characteristics formulated by schools and teachers based on factors such as academic conditions and individual development stages. The contradiction between normalized, qualitative or semi-quantitat...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06Q10/06G06Q50/20
CPCG06Q10/06393G06Q50/205
Inventor 黄涛
Owner 上海光数信息科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com