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Common Ground Inspection Method for Electronic Equipment and Its Touch Module and System

A technology for electronic equipment and touch modules, which is applied in the fields of electrical digital data processing, instruments, computing, etc., and can solve problems such as system false alarm points and whole machine signal interference.

Active Publication Date: 2022-04-12
INTERFACE TECH CHENGDU CO LTD +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Based on this, it is necessary to provide an electronic device and its touch module for the problem that the common ground between the touch module and the system is easily damaged by external factors, which will affect the whole machine test and generate signal interference, resulting in the occurrence of false alarm points in the system. Group and system co-location test method

Method used

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  • Common Ground Inspection Method for Electronic Equipment and Its Touch Module and System
  • Common Ground Inspection Method for Electronic Equipment and Its Touch Module and System
  • Common Ground Inspection Method for Electronic Equipment and Its Touch Module and System

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Embodiment Construction

[0038] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar improvements without departing from the connotation of the present invention, so the present invention is not limited by the specific embodiments disclosed below.

[0039] In describing the present invention, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", " Back", "Left", "Right", "Vertical", "Horizontal", "Top", "Bottom", "Inner", "Outer", "Clockwise", "Counte...

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Abstract

The invention relates to an electronic device and its touch module and system common ground inspection method, wherein the electronic device includes a metal casing, a power supply, a touch module and a detection pad, and the ground terminal of the power supply is grounded through the metal casing , the touch module includes a touch chip, the touch chip is provided with a ground pad and a signal receiving pin, the ground pad is configured to share the ground with the ground terminal of the power supply, and the detection pad is electrically connected to the signal receiving pin, And the detection pad is configured to form a parallel-plate capacitor with the metal casing when the ground pad and the ground end of the power supply share the same ground. The electronic device can solve the problem that the common ground between the touch module and the system is easily damaged by external factors, which affects the test of the whole machine and generates signal interference, which leads to the occurrence of false alarm points in the system.

Description

technical field [0001] The present invention relates to the technical field of electronic equipment, in particular to an electronic equipment and its touch module and system common inspection method. Background technique [0002] In electronic equipment, the common ground between the module and the system power supply ground can avoid signal interference and improve the signal-to-noise ratio, and provide a reference potential as a basis, which is very important in system design. For the touch module, it is more necessary to combine it with the display module and the application system to avoid being interfered by external signals and affecting the report processing. However, in practical applications, the common ground between the touch module and the system is easily damaged by external factors. It is difficult to be tested, which will affect the whole machine test and generate signal interference, resulting in the occurrence of false alarm points in the system. Contents...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F3/041G06F3/044
CPCG06F3/0412G06F3/044G06F2203/04102G06F2203/04103
Inventor 罗文凯谢宗谚
Owner INTERFACE TECH CHENGDU CO LTD