IC card chip and module chip testing system

A chip test, chip technology, applied in the detection of faulty computer hardware, record carriers used by machines, instruments, etc., can solve problems such as description, no electrical performance test method and technology, no electrical performance test, etc., to achieve convenient development Effect

Inactive Publication Date: 2004-02-04
SHANGHAI CHANGFENG SMART CARD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In September 1998, the technical document "CFJ-FORMAT JOB FILE MANUAL" (CFJ program work file manual) of the CMT-600R test system published by Ruhlamat, Germany also mentioned the related test sys

Method used

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  • IC card chip and module chip testing system
  • IC card chip and module chip testing system

Examples

Experimental program
Comparison scheme
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Example Embodiment

[0016] like figure 1 所示,本发明的测试系统具体包括:

[0017] PC board: inserted in the PC, the PC controls the test system through it.

[0018] DC parameter measurement unit PMU: Provides accurate voltage regulation or constant current power supply, and can perform high-precision voltage and current tests of various ranges.

[0019] Interface control board MIF: monitor whether the card is inserted and whether the signal light on the deck panel is lit.

[0020] The power supply DPS board of the device under test: consists of six units: DPS1, DPS2, VIH, VIL, VOH, and VOL. They can be connected to every pin of the device under test, that is, every contact of the chip, through a relay. The DPS board is the power supply for the device under test, providing a DC power supply with general accuracy, and can also perform voltage or current testing with general accuracy. 设置电压范围为-10-+10V,精度为20mV。 The test system has two power supplies, DPS1 is the main test power supply, and DPS2 is the backup pow...

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Abstract

The system includes PC board, DC parameter measuring unit PMU, interface control board MIF, power DPS board for component to be tested, input high-levl voltage VIH, input low-level voltage VIL, output high-level comprison voltage VOH, output low-level comparison voltage VOL, sic pieces of passage board and module driving system. The present invention can carry on test for six or eight contact IC modules or IC cards simultaneously as it applies 14 position D/A to carry on sampling for various types of electricities with the minimum current rate of progress at uA grade.

Description

technical field [0001] The invention relates to a chip testing system, in particular to an IC card chip and module chip testing system, which belongs to the technical field of smart card manufacturing. Background technique [0002] The core of IC cards and modules is an IC chip, and the most important test is to test the electrical performance of the chip. The electrical performance test of IC card chips or module chips is the same as that of IC chips. Contact IC cards are mainly divided into two categories: storage type and intelligent type (CPU card). The storage type IC card is mainly composed of EEPROM or FLASH Memory, as well as some interface circuits, boost circuits, password verification circuits, and counters. There are relatively mature test methods for the test of EEPROM and FLASH Memory. The test of the CPU card is more complicated. If the test is completely performed by the test instrument, the generation of the test program is very difficult work, the require...

Claims

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Application Information

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IPC IPC(8): G06F11/26G06K19/077
Inventor 杨新涛丁富强余中方王永宏陈华
Owner SHANGHAI CHANGFENG SMART CARD
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