Charged particle irradiation apparatus

a technology of irradiation apparatus and charged particles, which is applied in the field of charged particle irradiation apparatus, can solve the problems of deteriorating measurement accuracy

Active Publication Date: 2021-12-23
B DOT MEDICAL INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0044]The first embodiment of the present invention relates to a charged particle irradiation apparatus that performs scanning with a charged particle beam and irradiates an irradiation target spot by spot. In particular, the charged particle irradiation apparatus of the present embodiment mainly corrects a difference between an actual dose delivered in an irradiation target and a dose measured by a dose monitor, and the difference is caused by influence of ion recombination in the dose monitor provided to an irradiation nozzle.

Problems solved by technology

In measurement of a dose of a charged particle beam performed by a dose monitor, however, the measurement accuracy may be deteriorated because of influence of ion recombination and the like.

Method used

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first embodiment

[0044]The first embodiment of the present invention relates to a charged particle irradiation apparatus that performs scanning with a charged particle beam and irradiates an irradiation target spot by spot. In particular, the charged particle irradiation apparatus of the present embodiment mainly corrects a difference between an actual dose delivered in an irradiation target and a dose measured by a dose monitor, and the difference is caused by influence of ion recombination in the dose monitor provided to an irradiation nozzle.

[0045]Charged Particle Irradiation Apparatus 10

[0046]FIG. 1 is a schematic diagram of a configuration of a charged particle irradiation apparatus 10, and FIG. 2A and FIG. 2B are schematic diagrams of an irradiation nozzle 50 and scanning irradiation.

[0047]The charged particle irradiation apparatus 10 has an accelerator 20, a charged particle beam transport system 30, a focusing magnet 40, and an irradiation nozzle 50. Further, the charged particle irradiation...

second embodiment

[0090]The charged particle irradiation apparatus 10 of a second embodiment of the present invention is to correct a difference in dose caused by another influence in addition to the influence due to ion recombination in the dose monitor 54 (depending on a dose rate). Herein, another influence may be energy E (parameter dE / dx in the above equations) and a beam size S (parameters zmax and ymax in the above equations) of a charged particle beam and a position of the dose monitor 54 at which a charged particle beam passes.

[0091]The energy of a charged particle beam depends on the position in the depth direction of a spot in an irradiation target as described previously. The beam size of a charged particle beam depends on the size of one spot. The beam size of a charged particle beam may be the same or different for respective spots. Further, the position of the dose monitor 54 (ionization chamber) at which a charged particle beam passes depends on a spot position (coordinates).

[0092]Fir...

third embodiment

[0106]In the charged particle irradiation apparatus 10 of the third embodiment of the present invention, a second dose monitor 55 inside the irradiation nozzle 50 is further installed in addition to the first dose monitor 54 (FIG. 9A). The second dose monitor 55 is a backup dose monitor, which is a dose monitor mainly used for verifying whether or not there is an error in the dose measurement value of the first dose monitor 54.

[0107]The second dose monitor 55 is placed at the downstream of the first dose monitor 54 in the traveling direction of a charged particle beam. Further, in the present embodiment, the charged particle irradiation apparatus 10 further has a dose monitor output-correction factor storage unit 74 (FIG. 9B), which corrects a dose that is measured by the second dose monitor 55 placed at the downstream for influence of the first dose monitor 54 (mainly, influence of an energy loss of a charged particle beam) placed at the upstream. The dose monitor output-correction...

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Abstract

Provided is a charged particle irradiation apparatus that performs scanning with a charged particle beam and irradiates an irradiation target spot by spot. An embodiment of the present invention provides a charged particle irradiation apparatus (10) including: a first dose monitor (54) mounted in an irradiation nozzle (50); an irradiation pattern converting device (70) that generates irradiation control data used for controlling the charged particle irradiation apparatus (10) from treatment plan data including information on a dose rate and a dose of a charged particle beam for each spot; and a dose correction factor storage unit (72) that stores data of a dose correction factor with respect to a dose rate of a charged particle beam. The irradiation pattern converting device (70) is configured to select one spot in the treatment plan data, for instance.

Description

BACKGROUND OF THE INVENTIONField of the Invention[0001]The present invention relates to a charged particle irradiation apparatus that performs scanning with a charged particle beam and irradiates an irradiation target spot by spot (also referred to as “scanning irradiation”).Description of the Related Art[0002]Conventionally, particle therapy treatment to irradiate a malignant tumor such as a cancer with a charged particle beam (also referred to as “particle ray”) accelerated by high energy and treat the malignant tumor has been employed. In recent years, in particle therapy treatment using a charged particle beam such as a proton or a carbon, a new irradiation method called scanning irradiation has been paid attention, and the number of facilities that implement the scanning irradiation has increased. In the conventional particle therapy treatment, a broad beam irradiation method that statically expands a charged particle beam that is thin in the lateral direction (irradiation slic...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): A61N5/10
CPCA61N5/1067A61N5/1077A61N2005/1087A61N5/103A61N5/1071A61N5/1075A61N5/1065A61N5/1042A61N5/1031A61N2005/1074
Inventor TANSHO, RYOHEITAKI, YOSHIAKIFURUKAWA, TAKUJIHARA, YOUSUKE
Owner B DOT MEDICAL INC
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