Patents
Literature
Patsnap Eureka AI that helps you search prior art, draft patents, and assess FTO risks, powered by patent and scientific literature data.

3results about "X-ray tube cathode assembly" patented technology

Flat emitter with compliant supported end

ActiveUS12653467B2X-ray tube electrodesX-ray tube cathode assembly
Various methods and systems are provided for an emitter assembly for a cathode of an X-ray tube. In one example, an emitter assembly comprises a first end of a substantially flat emitter supported by two rods extending from a two-rod insulator assembly, and a second end of the substantially flat emitter supported by a compliant, single rod insulator assembly.
Owner:GE PRECISION HEALTHCARE LLC

Vacuum tube insertion assembly with feedthrough pin plug and mating socket

PendingJP2026090268AX-ray tube electrodesX-ray tube cathode assembly
We provide a vacuum tube insertion assembly that prevents incorrect connections. [Solution] The vacuum tube insertion assembly includes a flared insertion part 40, each constructed from glass, having an annular flange 45 and a stem 46. The stem 46 extends axially from the flange 45, which surrounds the outer edge 47 of a plug recess 44 defined by the stem 46. A feedthrough pin 42 passes axially through the stem 46 and is sealed to the stem 46. The feedthrough pin 42 terminates inside the plug recess 44 to form the plug. The socket includes a receptacle that connects to the plug within the plug recess and is removably coupled to the feedthrough pin.
Owner:VAREX IMAGING CORP

Total internal reflection fluorescent x-ray analyzer

ActiveEP4257961B1Material analysis using wave/particle radiationCathode ray concentrating/focusing/directing
Provided is a total reflection X-ray fluorescence spectrometer which has high analysis sensitivity and analysis speed. The total reflection X-ray fluorescence spectrometer includes: an X-ray source that has an electron beam focal point having an effective width in a direction parallel to a surface of a sample, and orthogonal to an X-ray irradiation direction, that is larger than a dimension in the irradiation direction; a reflective optic that has an effective width in the orthogonal direction that is larger than that of the electron beam focal point, and has a curved surface in the irradiation direction; and a plurality of detectors that are arranged in a row in the orthogonal direction, and are configured to measure intensities of fluorescent X-rays emitted from the sample irradiated with primary X-rays focused by the reflective optic.
Owner:RIGAKU CORP