A structure of SET collecting and detecting circuit

Abstract

A structure of SET collecting and detecting circuit comprises collecting circuit and detecting circuit. Level signal D outputs, through collecting circuit, N level signals Y which are in a same or reverse phase with level signal D. The event incidence into the collecting circuit triggers transient pulse of level signal Y. Under the effect of clock signal CLK, the detecting circuit captures the transient pulse. The collecting circuit has N links formed through cascading of cell circuits. The component links of the collecting circuit in the present invention reflect the states of most of the common circuit nodes in digital circuit. Through obtaining the single-event transient pulse width distribution of the circuit structure, the transient pulse status of most of the common circuit nodes indigital circuit after single-event incidence may be reflected. The present invention may be used to effectively assess the SET sensitivity of digital circuits and the processes on which digital circuits are based and provides a basis for anti-single event radiation hardening of digital circuits.

Description

A single event transient pulse collection and detection circuit structure technical field The invention relates to a single event transient pulse collection and detection circuit, in particular to a collection and detection circuit capable of effectively characterizing the single event transient sensitivity of a digital circuit by detecting the single event transient pulse width, as an anti-single event radiation reinforcement basis. Background technique Radiation produced by high-energy protons or high-energy neutrons hitting atomic nuclei and heavy nuclear particles in cosmic rays can cause circuit state changes, such as transient pulses in combinatorial logic, bit flips in memory-like cells, etc. This effect is a single particle The result of the action is often called a single event effect. Single event effects can be divided into single event upset (SEU), recoverable single event latch (SEL), single event transient (SET) and other single event soft errors, and also i...

AI Technical Summary

Problems solved by technology

Knowing the radiation resistance reinforcement based on such data will often make the redundancy in the design too wide or too loose, causing unnecessary performance overhead or reducing the reinforcement performance to meet expectations

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