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High-resolution reflection type high-speed rotating mirror interference spectrometer

A high-resolution, reflective technology, applied in the field of interference spectrometers, can solve the problems of low environmental adaptability and anti-interference ability, low time utilization rate, and difficulty in meeting requirements, and achieves easy processing and operation, simple structure, convenient Lightweight effect

Inactive Publication Date: 2010-07-21
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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  • Abstract
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Problems solved by technology

[0003] The traditional Fourier transform spectrometer usually scans at a rate of 0.1-10cms -1 (optical path difference), although they can better meet the requirements of high resolution in many occasions, but it is difficult to meet the requirements of non-repeatable fast measurement and modulation process
In addition, in the actual development process, such as the typical Michelson interferometer, there will be many problems: ① need auxiliary optical path, complex structure; ② poor stability, low environmental adaptability and anti-interference ability; ③ low time utilization, only about 50%; etc.
It makes the actual design and assembly very difficult to realize, and at the same time faces the challenges of performance stability and reliability under long-term operating conditions

Method used

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  • High-resolution reflection type high-speed rotating mirror interference spectrometer
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Embodiment Construction

[0016] see figure 1 , the present invention provides a high-resolution reflective high-speed rotating mirror interferometric spectrometer, including a first rotating moving mirror 7 and a second rotating moving mirror 5, and the second rotating moving mirror 5 is a plane mirror.

[0017] The first rotating mirror 7 and the second rotating mirror 5 are parallel, and can be a split structure or a combined structure. When the first rotating mirror 7 and the second rotating mirror 5 are of a split structure, the first rotating When the moving mirror 7 and the second rotating moving mirror 5 rotate, the relative distance between them remains constant.

[0018] When the first rotating mirror 7 and the second rotating mirror 5 were combined, the first rotating mirror 7 and the second rotating mirror 5 fixed two plane mirrors together or made two parallel surfaces of transparent materials Formed by coating with reflective film.

[0019] The target radiation is incident on the beam s...

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Abstract

The invention relates to a high-resolution reflection type high-speed rotating mirror interference spectrometer which comprises a first rotating mirror and a second rotating mirror, wherein the second rotating mirror is a plane mirror. The invention provides the high-resolution reflection type high-speed rotating mirror interference spectrometer which can improve the spectral resolution of a system, can simplify the structure of the system and has large view field angle.

Description

technical field [0001] The invention relates to an interference spectrometer, in particular to a high-resolution reflective high-speed rotating mirror interference spectrometer. Background technique [0002] The emergence of interferometric spectrometers overcomes the disadvantages of low energy utilization of traditional dispersive spectrometers (splitter prisms, dispersive prisms, and diffraction gratings, etc.), and the Fourier transform interferometric spectrometer based on time modulation inherits the advantages of traditional interferometric spectrometers. Channel (Felleget advantage), high throughput (Jacquinot advantage), high wave number accuracy (Connes advantage), low noise, fast measurement speed and other advantages in one body. It has expanded the research field of infrared spectroscopy, and has received widespread attention from all over the world in the past two decades and has developed rapidly. It has a wide range of applications in industrial and agricultu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/26G01J3/45
Inventor 魏儒义周锦松相里斌王维
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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