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Device and method for measuring damage threshold value of optical thin film irradiated by dual-wavelength laser simultaneously

A dual-wavelength laser and damage threshold technology, applied in optics, optical components, testing optical performance, etc.

Active Publication Date: 2012-05-09
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Application Information

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Problems solved by technology

At present, there is no measurement device and evaluation method for the damage threshold of optical thin films under simultaneous irradiation of two wavelengths of laser light at home and abroad.

Method used

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  • Device and method for measuring damage threshold value of optical thin film irradiated by dual-wavelength laser simultaneously
  • Device and method for measuring damage threshold value of optical thin film irradiated by dual-wavelength laser simultaneously
  • Device and method for measuring damage threshold value of optical thin film irradiated by dual-wavelength laser simultaneously

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Embodiment Construction

[0025] The present invention will be further described below in conjunction with the embodiments and accompanying drawings, but the protection scope of the present invention should not be limited thereby.

[0026] see first figure 1 , figure 1 It is a structural schematic diagram of Embodiment 1 of the dual-wavelength laser simultaneous irradiation optical film damage threshold measurement device of the present invention. It can be seen from the figure that the dual-wavelength laser simultaneous irradiation optical thin film damage threshold measurement device of the present invention includes an output wavelength of λ 1 The first laser 2 and the output wavelength is λ 2 The second laser 3 is used to collimate the optical path and assist in monitoring damage and destruction. The third laser 7 is a sample to be tested 28 located on a mobile platform 27, and its composition is:

[0027] On the first laser path output by the first laser 2, the first energy attenuator 8, the fir...

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Abstract

The invention relates to a device and a method for measuring a damage threshold value of an optical thin film irradiated by dual-wavelength laser simultaneously. In the measuring device, the energy and spot size of the laser with different wave lengths are controlled respectively by adopting two different groups of optical paths and the measuring device ensures the consistency of the time of the dual-wavelength laser reaching the surface of a sample to be tested by an optical path delay method. The damage threshold value of the sample to be tested which is acted by the dual-wavelength laser lambda 1 and lambda 2 simultaneously is measured by a method for fixedly selecting the energy density of the laser with a certain wave length lambda 1; and the contribution of the laser with different wave lengths to the damage of the optical thin film is judged by a threshold value difference comparison method. Through the device and the method, the damage threshold value of the optical thin film irradiated by the dual-wavelength laser simultaneously can be obtained; and the contribution of the laser with a certain wave length to the damage can be evaluated.

Description

technical field [0001] The invention relates to the evaluation of optical properties of optical films, in particular to a measuring device and method for the damage threshold of optical films under simultaneous irradiation of dual-wavelength lasers. Background technique [0002] In the current international standard ISO 11254-1, there is only one measurement device and evaluation system for laser irradiation of optical films with one wavelength. The basic method is to irradiate the film with a single wavelength of laser light, and judge the number S of damage points of the film under a certain energy density E. Generally, if 10 points are measured, the probability of damage occurrence is obtained as P=S / 10, and then the number of damage points is changed. Energy density E 1 ,E 2 ..., and retrieve the corresponding damage probability P 1 , P 2 ..., the damage threshold value Φ can be obtained by taking the damage probability P obtained by straight line fitting and the cor...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02G02B7/02G02B5/30G02B26/08
Inventor 周明李大伟赵元安邵建达范正修
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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