X-ray wavelength dispersion and diffraction based hazardous article detection method

A wavelength dispersion and detection method technology, applied in the field of X-ray applications, can solve problems such as inability to monitor

Inactive Publication Date: 2011-02-09
SHANGHAI JIAO TONG UNIV
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  • Claims
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Problems solved by technology

Although the existing fluoroscopy method can judge whether it is a dangero

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  • X-ray wavelength dispersion and diffraction based hazardous article detection method
  • X-ray wavelength dispersion and diffraction based hazardous article detection method
  • X-ray wavelength dispersion and diffraction based hazardous article detection method

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Embodiment Construction

[0036] The embodiments of the present invention are described in detail below. This embodiment is implemented on the premise of the technical solution of the present invention, and detailed implementation methods and specific operating procedures are provided, but the protection scope of the present invention is not limited to the following implementation example.

[0037] This embodiment includes the following steps:

[0038] The first step is to use the current X-ray fluoroscopy to obtain the projection image of the object to be inspected, and judge whether the object to be inspected is dangerous by visual inspection;

[0039] The second step is to take out the suspected dangerous goods and place them on both sides of the diffraction device for X-ray wavelength dispersion diffraction detection to realize the online detection and on-site identification of dangerous goods.

[0040] Such as figure 1 As shown, the diffraction device includes: an X-ray source 1, an aperture ass...

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Abstract

The invention relates to an X-ray wavelength dispersion and diffraction based hazardous article detection method in the technical field of X-ray application. In the invention, a limit crack is arranged on the emergent surface of a sample, on-line detection is carried out by using a Mo or Ag target characteristic radiation X-ray transmission-type wavelength dispersion and diffraction method, and areflecting type X-ray wavelength dispersion and diffraction method is used for site identification. The method can be used for detecting a hazardous article of a small bag and finally judging the hazardous article is what kind of explosive or poison; the direct detection thickness is from a few centimeters to scores of centimeters, and because the detection part is a small size part of the bag, the size of an actual object to be measured is larger; through the on-line inspection by the transmission-type X-ray wavelength dispersion and diffraction and site identification by the reflecting typeX-ray wavelength dispersion and diffraction, an object to be detected can be completely and correctly judged to be what kind of substance, and packaged objects can be separated from the hazardous article, which cannot be realized through any other non-diffraction method and is unmatched.

Description

technical field [0001] The invention relates to a method in the field of X-ray application technology, in particular to a method for detecting dangerous goods based on X-ray wavelength dispersion diffraction. Background technique [0002] Up to now, X-ray fluoroscopy devices are still used in airports, stations, docks, customs and public places, and government security inspections, based on the shape of the projected image of the object, the experience of contrast (contrast) details, and whether there is a detonator. A similar detonating device is used to judge whether the object to be tested is an explosive (dangerous) suspicious item. The application of the newly developed X-ray computerized tomography (abbreviated as CT), the image is much clearer than direct perspective, but it is still only sensitive to metal parts, and it cannot determine what kind of drug and explosive the object to be tested is? It is possible to solve this problem if the diffraction method is used....

Claims

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Application Information

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IPC IPC(8): G01N23/20G01V5/00G01B15/02
Inventor 杨传铮陈艳华姜传海
Owner SHANGHAI JIAO TONG UNIV
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