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System and method for analyzing development trend of patent technology

A technology development and trend analysis technology, applied in special data processing applications, instruments, electrical digital data processing, etc.

Inactive Publication Date: 2011-03-23
J Z M C INTPROP DATA SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, R&D personnel pay more attention to the development and changes of patented technologies, or even the development of a specific technology in a certain field, and the number of patent applications alone cannot meet this demand.

Method used

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  • System and method for analyzing development trend of patent technology
  • System and method for analyzing development trend of patent technology
  • System and method for analyzing development trend of patent technology

Examples

Experimental program
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Embodiment Construction

[0020] Such as figure 1 The overall frame diagram of the analysis system is shown. The system is based on a patent database 10. Multiple display terminals, such as Terminal 1, Terminal 2...Terminal N, convert the patent data retrieved from the patent literature databases of various countries into a unified format and store them in the patent database. Chinese patent data include at least patent bibliographic items, patent abstracts and patent claims.

[0021] The analysis system 20 includes a special subject establishment module 201 for collecting and analyzing data from the patent database 10 to establish a patent analysis subject database; a technology classification module 202 for classifying patent documents in the patent analysis subject database by technology; Select the technical classification selection module 203 of the patent technology classification, the technical classification selection module is used to select one or select multiple technical classifications at...

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Abstract

The invention provides a system and a method for analyzing the development trend of patent technology in patent analysis. The patent analyzing system is based on a patent database and a display terminal, and comprises a subject establishing module, a technology classifying module, a technology classification selecting module and an image displaying module. The method comprises the following steps of: (1) establishing a patent database in a national patent document database according to a preset technology subject by searching; (2) searching the patent in the patent database by using the subject establishing module and establishing a patent analysis subject base; (3) classifying the patent document in the patent analysis subject base according to the technology by using the technology classifying module; (4) selecting the analyzed technology classification by using the technology selecting module; and (5) displaying the calendar-year patent applying amount or public amount curve graph under the technology classification by using the image displaying module. In the invention, the calendar-year development trend of the patent technology can be intuitively and accurately reflected through the curve graph.

Description

technical field [0001] The invention relates to a patent technology development trend analysis system and analysis method in patent analysis. Background technique [0002] In the current patent analysis, the trend analysis of the number of patent applications over the years has become an important indicator of analysis, which reflects the development and changes of the number of patent applications over the years from a macro perspective, and then reflects the development trend of patent applications. However, R&D personnel pay more attention to the development and changes of patented technologies, or even the development of a specific technology in a certain field, and the number of patent applications alone cannot meet this demand. Contents of the invention [0003] The purpose of the present invention is to provide a specific patent technology development trend analysis system in patent analysis, which intuitively and accurately reflects the development trend of patent ...

Claims

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Application Information

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IPC IPC(8): G06F17/30
Inventor 唐向东魏国柱
Owner J Z M C INTPROP DATA SCI & TECH
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