Television testing method, device and system

A test method and TV technology, applied in TV, electrical components, image communication, etc., can solve the problems of affecting promotion, not being able to be used as a general-purpose screen at the same time, and poor compatibility, so as to reduce testing costs, realize fully automatic testing, and improve testing efficiency effect

Active Publication Date: 2011-08-31
SHENZHEN TCL NEW-TECH CO LTD
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  • Summary
  • Abstract
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  • Claims
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AI Technical Summary

Problems solved by technology

Although there is currently an LVDS (Low-Voltage Differential Signaling) acquisition card developed by an American company that can assist testing, the acquisition card has a single function and cannot be used as a general-purpose screen at the same time, and its price is very expensive, which affects its use in LCD TVs. Promotion in the field of computer ...

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  • Television testing method, device and system
  • Television testing method, device and system
  • Television testing method, device and system

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Embodiment Construction

[0056] It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.

[0057] figure 1 Shows the flow of the TV test method in an embodiment of the present invention. The process includes the following steps:

[0058] Step S10: Receive the LVDS output from the tested motherboard and convert it to TTL level output; in one embodiment, THC63LVD104A, a processing chip from THINE, can be used to convert the LVDS of the tested motherboard to TTL level. All LVDS is included in the level.

[0059] Step S20, receiving the TTL level and programming according to the information contained therein, and outputting general screen test data; in one embodiment, after receiving the TTL level, performing software programming according to the LVDS contained therein, the programming language can be It is the hardware description language Verilog.

[0060] Step S30, receiving the test data of the universal sc...

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Abstract

The invention provides a television testing method, device and system. The method comprises the following steps: receiving an LVDS (low-voltage differential signal) output by a mainboard to be tested, and converting the LVDS into TTL (Transistor-transistor logic) level to be output; receiving the TTL level, programming according to the information contained in the TTL level, and outputting test data of a general screen; and receiving the test data of the general screen, and converting the test data of the general screen into an LVDS format to be output to the general screen to be used. The invention also provides the television testing device and the television testing system. The television testing method and the television testing device or the television testing system provided by the invention, can reduce the testing cost and improve the testing efficiency.

Description

Technical field [0001] The invention belongs to the technical field of TV testing, and relates to a TV testing method, device and system, and in particular to a testing method, device and system of an LCD TV motherboard that can reduce testing costs and improve testing efficiency. Background technique [0002] At present, the production testing of LCD (Liquid Crystal Display) televisions by several major domestic TV manufacturers is basically at the stage of traditional manual viewing testing. Although there are currently LVDS (Low-Voltage Differential Signaling) capture cards developed by American companies that can assist in testing, the capture card has a single function and cannot be used as a general-purpose screen at the same time, and its price is very expensive, which affects its use in LCD TVs. Promotion in the field of machine testing. In addition, there are many types of LCD motherboards. Different LCD motherboards use different screens. In the PCBA (Printed Circuit B...

Claims

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Application Information

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IPC IPC(8): H04N17/00H04N17/04
Inventor 朱华犬周文高
Owner SHENZHEN TCL NEW-TECH CO LTD
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