Television testing method, device and system
A test method and TV technology, applied in TV, electrical components, image communication, etc., can solve the problems of affecting promotion, poor compatibility, and not being able to be used as a general-purpose screen at the same time, so as to reduce test cost, improve test efficiency, and realize fully automatic  The effect of the test
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[0056] It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention.
[0057] figure 1 Shows the flow of the TV test method in an embodiment of the present invention. The process includes the following steps:
[0058] Step S10: Receive the LVDS output from the tested motherboard and convert it to TTL level output; in one embodiment, THC63LVD104A, a processing chip from THINE, can be used to convert the LVDS of the tested motherboard to TTL level. All LVDS is included in the level.
[0059] Step S20, receiving the TTL level and programming according to the information contained therein, and outputting general screen test data; in one embodiment, after receiving the TTL level, performing software programming according to the LVDS contained therein, the programming language can be It is the hardware description language Verilog.
[0060] Step S30, receiving the test data of the universal scre...
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