A compound ion source

A compound ion and ion technology, applied in the field of compound ion sources, can solve the problems of less sample structure information, low ionization efficiency, and small energy dispersion, and achieve the effects of improving utilization rate and ionization efficiency, increasing sensitivity, and reducing difficulty

Active Publication Date: 2011-12-28
XIAMEN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0009] Compared with the electron bombardment source, the disadvantage of the PI source is that the fragment ions are weak, the sample structure information is less, and the ionization efficiency is low; the advantage is that it is dominated by molecular ion peaks, and the energy dispersion is small

Method used

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  • A compound ion source
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Embodiment Construction

[0026] The present invention will be further described below in conjunction with drawings and embodiments.

[0027] Such as figure 1 with 2 As shown, the embodiment of the present invention is provided with ionization chamber 2, sample introduction conduit 13, repeller 1, ion extraction pole piece 5, focusing pole piece 6, exit pole piece 7, upper grid 4, mirror 3 (coating reflection mirror), lower grid 11, glass window 10 (quartz glass), condenser mirror 9 (quartz glass), ultraviolet lamp 8 (photon emission tube) and filament 12 (tungsten wire)

[0028] The ionization chamber 2 is a stainless steel ionization chamber, and the ionization chamber 2 is a square cavity shell. The shell wall of the cavity shell is provided with a left through hole 21, a right through hole 22, an upper through hole 23 and a lower through hole 24. The hole 21 is coaxial with the right through hole 22, the upper through hole 23 is coaxial with the lower through hole 24, and the axis of the left thr...

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Abstract

The invention provides a compound ion source, relating to a mass spectrometer. The compound ion source is applied to the mass spectrometer and has the advantage of combining the advantages of an electron bombardment source and a photoionization source, not only acquiring the fragment information of samples and the integral molecular ion peaks simultaneously, and reducing the difficulty in spectrogram analysis, but also improving the use ratio and IE (ionization efficiency) of the samples obviously to further improve the flexibility of the mass spectrometer, and being suitable for ionizing gaseous samples. The compound ion source comprises an ionization chamber, a sample import conduit, a repulsion electrode, an ion export pole piece, a focusing pole piece, an emitting pole piece, an uppergrid mesh, a reflecting mirror, a lower grid mesh, a glass window, a collecting mirror, a photon emission tube and lamp filaments.

Description

technical field [0001] The invention relates to a mass spectrometer, in particular to a composite ion source for ionizing gaseous samples. Background technique [0002] Mass spectrometer is one of the most important members in the field of modern scientific analytical instruments and one of the most advanced means of modern analytical science. It is a modern precision analytical instrument that ionizes the sample first, and then passes through the preset electric field or magnetic field to realize the mass-to-charge ratio separation and detect the corresponding peak intensity, so as to achieve qualitative and quantitative analysis of the sample. . From the initial isotope analysis, mass spectrometry has gradually become an indispensable analysis and detection method in many aspects such as chemistry, geology, biochemistry, pharmacy, medicine, petrochemical industry, energy, environmental protection and food processing. [0003] Regardless of the type of mass spectrometer, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/16
Inventor 何坚
Owner XIAMEN UNIV
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