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Temperature acceleration reference stress determination method in acceleration life test of spatial electronic equipment

A technology for accelerated life testing and electronic equipment, applied in the direction of measuring electricity, measuring electrical variables, measuring devices, etc., and can solve problems such as increasing test costs

Active Publication Date: 2012-06-27
NO 510 INST THE FIFTH RES INST OFCHINA AEROSPAE SCI & TECH
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  • Abstract
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Problems solved by technology

Obviously, the acceleration coefficient obtained in this way and the resulting reliability evaluation results are all smaller than the actual situation, and unnecessary test costs will be added, especially when the working environment temperature varies in a large range, the disadvantages of using this method are even greater. Can not be ignored

Method used

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  • Temperature acceleration reference stress determination method in acceleration life test of spatial electronic equipment
  • Temperature acceleration reference stress determination method in acceleration life test of spatial electronic equipment
  • Temperature acceleration reference stress determination method in acceleration life test of spatial electronic equipment

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Embodiment Construction

[0019] The present invention will be further described below in conjunction with embodiment.

[0020] Firstly, according to the periodic change of the working environment temperature, the ambient temperature is divided into equal steps, where T in the sub-graph (a) 0 is a constant working environment temperature; T in sub-graph (b) U , T L are the upper limit working environment temperature and the lower limit working environment temperature respectively, t c is the time for a cycle of temperature change in the working environment; T in sub-graph (c) U , T L They are the upper limit working environment temperature and the lower limit working environment temperature respectively, at this time T L Also represents the constant working environment temperature, t 0 , t c Respectively is the time corresponding to a cycle of temperature change in the working environment (t 0 +t c ) in the time of constant working environment temperature and the time of changing working enviro...

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Abstract

The invention, which belongs to the electronic product technology filed, relates to a temperature acceleration reference stress determination method in an acceleration life test of spatial electronic equipment. For periodic variation of a working environmental temperature, equal step segmentation is carried out on the environmental temperature and then reliability of a corresponding time slot under each step temperature is respectively calculated; reliability of one period and a whole life telophase is calculated and an improved reliability index computational formula is given; and when the working environmental temperature is selected as an accelerated stress, that is, an acceleration life test of spatial electronic equipment is carried out by improving the working environmental temperature, the improved reliability index computational formula should be employed; and on the premise that the reliability is invariant, the working environmental temperature with periodic variation is converted equivalently into a constant type working environment temperature, so that a reference stress is determined. According to the invention, a technical problem that how to accurately determine a temperature acceleration reference stress when an acceleration life test of spatial electronic equipment is carried out by improving a working environmental temperature can be solved.

Description

technical field [0001] The invention is used to determine the temperature acceleration reference stress in the accelerated life test of the space electronic equipment of the spacecraft under the changing working environment temperature, and belongs to the technical field of electronic products. Background technique [0002] Reliability prediction is a work to estimate the reliability of a product under given working conditions. One of its main purposes is to provide a basis for research on reliability growth tests, qualification tests, and cost accounting. It can be seen from this purpose that it is very important to provide accurate reliability prediction results of products. For electronic products, reliability prediction is usually to calculate the reliability of products. [0003] As an electronic product, space electronic equipment adopts stress analysis method for reliability prediction, and the stress value during its working period should be constant to be calculate...

Claims

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Application Information

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IPC IPC(8): G01R31/00
Inventor 刘华罡王卫国王少宁
Owner NO 510 INST THE FIFTH RES INST OFCHINA AEROSPAE SCI & TECH
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