Highly-reliable pulse counting test system based on FPGA (Field Programmable Gate Array)

A test system and pulse counting technology, which is applied in the direction of electronic circuit testing, etc., can solve the problems of high labor intensity, many instruments and equipment, and difficulty in ensuring real-time performance, and achieve strong real-time performance and stable and reliable functions

Active Publication Date: 2012-07-11
XIAN AEROSPACE PRECISION ELECTROMECHANICAL INST
View PDF3 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The traditional pulse counting method is based on the bus and hardware interrupts. It is difficult to ensure real-time performance when the input pulse frequency is high, and there are counting errors; moreover, the test system contains many instruments and equipment, which is not universal and labor-intensive. Many human errors, low test efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Highly-reliable pulse counting test system based on FPGA (Field Programmable Gate Array)
  • Highly-reliable pulse counting test system based on FPGA (Field Programmable Gate Array)
  • Highly-reliable pulse counting test system based on FPGA (Field Programmable Gate Array)

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] 1. For the pulse generating circuit see Figure 5 , The external high-precision clock source frequency signal is provided to the pulse generation circuit as a time base signal after passing through the hardware PLL phase-locked loop, and the frequency can reach 200MHz; the same number of 64-bit preset cycle counters are configured inside the FPGA according to the number of output pulses. For For each output pulse, set the cycle value of the cycle counter (equivalent to setting the pulse period), the rising edge register, and the falling edge register, introduce the time base signal into the cycle counter to count, and compare the count value with the values ​​of the two registers Comparing in the device, respectively controlling the rising edge and falling edge of the generated pulse; the output pulse outputs multiple pulses (pulse 1, pulse 2, pulse 3...) after passing through the level drive circuit.

[0030] The accuracy of the pulse generated by the pulse generation ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a highly-reliable pulse counting test system based on FPGA (Field Programmable Gate Array). The highly-reliable pulse counting test system based on FPGA comprises a test system, a digital multimeter and auxiliary equipment, wherein the auxiliary equipment is used for generating a test current and providing the test current to a circuit to be tested, the test system provides a sampling control signal to the digital multimeter and provides multiple paths of pulses for the circuit to be tested, and the digital multimeter carries out voltage sampling to the test current of the auxiliary equipment under the control of the sampling control signal. The highly-reliable pulse counting test system based on FPGA solves the technical problems of pulse counting methods in prior arts that real-time property is hard to guarantee, counting errors exist, the test system involves many instruments and equipment, the universality is not strong, labor intensity is high, relatively numerous personal errors exist, and testing efficiency is low; and the highly-reliable pulse counting test system based on FPGA can realize highly-reliable reversible counting of multiple paths of pulses, can output multiple paths of pulse signals with adjustable time sequence, and can measure related technical indexes of an I/F conversion circuit.

Description

technical field [0001] The invention relates to an FPGA-based high-reliability pulse counting test system. Background technique [0002] High-precision I / F conversion circuit is the core circuit in the inertial measurement device, and its performance index directly affects the measurement accuracy of the inertial measurement device. Therefore, it is very important to accurately test the performance index of the high-precision I / F conversion circuit. [0003] The output of the I / F conversion circuit is 2 to 13 pulses with strict timing and logic relationship. The traditional pulse counting method is based on the bus and hardware interrupts. It is difficult to ensure real-time performance when the input pulse frequency is high, and there are counting errors; moreover, the test system contains many instruments and equipment, which is not universal and labor-intensive. There are many human errors and the test efficiency is low. In order to improve the test process, increase pr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
Inventor 任宾崔颖徐亮郭林肖
Owner XIAN AEROSPACE PRECISION ELECTROMECHANICAL INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap