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Generating column offset corrections for image sensors

An image sensor and offset correction technology, which is applied in the field of column offset correction for compensating column fixed pattern noise in image sensors and column fixed pattern noise, and can solve problems such as doubling of column fixed pattern noise

Active Publication Date: 2015-03-25
OMNIVISION TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Unfortunately, column fixed pattern noise is also amplified by the gain, making column fixed pattern noise artifacts more noticeable in the image
For example, a doubling of the gain results in doubling the column fixed pattern noise

Method used

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  • Generating column offset corrections for image sensors
  • Generating column offset corrections for image sensors
  • Generating column offset corrections for image sensors

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Embodiment Construction

[0018] Throughout the specification and claims, the following terms take the meanings explicitly associated therewith, unless the context clearly dictates otherwise. The meanings of "a" and "the" include plural references and the meaning of "in" includes "in" and "on". The term "connected" means either a direct electrical connection between the items that are connected, or an indirect connection via one or more passive or active intermediary devices. The term "circuitry" means a single component or multiple components, whether active or passive, connected together to provide a desired function. The term "signal" means at least one current, voltage or data signal.

[0019] Additionally, directional terms such as "on," "above," "top," "bottom" are used with reference to the orientation of the depicted figures. Because components of embodiments of the present invention may be positioned in many different orientations, directional terms are used for purposes of illustration only...

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Abstract

An image sensor includes multiple photoactive pixels and multiple dark reference pixels arranged in rows and columns to form a pixel array. A dark signal is read out of one or more dark reference pixels in each column and used to determine a column offset for one or more columns in the pixel array. An offset window is used for each column in the pixel array to define an acceptable maximum dark signal and an acceptable minimum dark signal for each column. The dark signals from each column are analyzed to determine if there are any dark signals outside the offset window. If any of the dark signals are outside the offset window, the dark signal or signals can be compensated for or discarded.

Description

technical field [0001] The present invention relates generally to image sensors, and more particularly, to methods for compensating for column fixed pattern noise in image sensors. More specifically, the present invention relates to methods for generating column offset corrections to compensate for column fixed pattern noise in image sensors. Background technique [0002] Complementary metal-oxide-semiconductor (CMOS) image sensors typically contain a plurality of pixels arranged in rows and columns to form a pixel array. Column output circuitry is connected to each column of pixels in the array to read out signals from the pixels in the column. Output signals from a row of pixels are read out of the pixel array one row at a time (in parallel) through the column output circuits. [0003] Column output circuitry may include both analog and digital circuitry, including capacitors, switches, multiplexers, transistors, and amplifiers. The quality of an image captured by a CMO...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N5/361H04N5/365
CPCH04N5/361H04N5/3658H04N25/677H04N25/63
Inventor 杰夫里·S·格斯滕伯格拉维·姆鲁斯尤恩贾亚大卫·温斯顿·毕肖普
Owner OMNIVISION TECH INC