Film sample stretching device used for being matched with atomic force microscope (AFM)

Abstract

The invention discloses a film sample stretching device used for being matched with an atomic force microscope (AFM). According to the film sample stretching device, an inwardly concave groove is formed in a base seat, guide rails are arranged on two sides of the front portion of the groove in the base seat, a threaded hole is formed in the rear end of the base seat, a propulsion screw is in threaded connection with the threaded hole, penetrates through a right fixture central hole and abuts against a left fixture. A right fixture is fixed in the rear portion of the groove in the base seat. The left fixture is located on the guiding rails and is in slide connection with the guide rails. The left fixture is composed of a cover plate and a bottom plate, the right fixture is composed of a cover plate and a bottom plate, the cover plate and the bottom plate of the left fixture are fixedly connected through bolts, and the cover plate and the bottom plate of the right fixture are fixedly connected through bolts. The film sample stretching device used for being matched with the AFM solves the problem that the size and the structure of a sample to be tested are strictly restricted and is applicable to materials with high strain rates; and moreover, the production fees are reduced, and demands of the majority of ordinary AFM users can be met.

Description

technical field [0001] The invention relates to a thin film sample stretching device for an atomic force microscope, in particular to an improvement on its structure. Background technique [0002] In order to organically combine the measurement of the mechanical properties of nanomaterials and products with the detection of microscopic morphology, micro-nano observation instruments such as atomic force microscopes (AFM) should be used in conjunction with some mechanical testing devices, so that various nanomaterials and Microscopic damage and fracture behavior and mechanism of products, and their correlation with load action, material structure and performance. [0003] There is a cross-scale micro-nano-scale in-situ tensile mechanical performance testing device, which has the following limitations: strict restrictions on the size and structure of the tested sample; the maximum strain cannot meet the high strain rate materials, and because these devices are relatively Compl...

AI Technical Summary

Problems solved by technology

[0003] There is a cross-scale micro-nano-scale in-situ tensile mechanical performance testing device, which has the following limitations: strict restrictions on the size and structure of the tested sample; the maximum strain cannot meet the high strain rate materials, and because these devices are relatively Complex, including force sensors, stepping motors, etc., so the production cost is relatively high, and cannot meet the needs of ordinary atomic force microscope users

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