Method and apparatus for simultaneous RF testing of multiple devices in a specific frequency band

Abstract

The present disclosure provides a method and apparatus for simultaneously performing radio frequency testing on multiple devices in a specific frequency band. Among them, a system employing a vector signal generator (VSG) and vector signal analyzer (VSA) module or card configured to test multiple devices under test simultaneously. Each VSG is configured to generate and send multiple RF test signals to multiple devices under test simultaneously. Similarly, each VSA is configured with multiple signal receiving modules connected to a single controller or memory. Each signal receiving module receives an RF signal from the device under test, converts it into a baseband digital signal, and transmits the digital signal to the VSA memory. A single RF test system may employ multiple such VSGs and VSAs, each capable of evaluating multiple devices under test. Each VSG / VSA may also be tuned to operate in a discrete or defined frequency band that is narrower than that of conventional RF testers and may correspond to various wireless standards.

Description

technical field [0001] Embodiments of the invention generally relate to radio frequency (RF) testing. More specifically, the embodiments of the present invention relate to a method and an apparatus for simultaneously performing a radio frequency test on multiple devices in a specific frequency band. Background technique [0002] Recently, the proliferation of wireless devices and other systems with RF transmit / receive capabilities (such as cellular phones and RF modules, as well as other RF-capable devices (such as ICs), base stations, RF transmitters, other wireless systems) has resulted in increased The need for RF test equipment. Such test equipment, which is typically used to test the RF functionality of a wireless device, typically operates by sending RF test signals, including data or commands, to a target wireless device or device under test. The device under test is programmed to generate specific RF signals in response, and these response signals are sent back to ...

AI Technical Summary

Problems solved by technology

[0003] However, current modular RF test equipment suffers from several disadvantages

For example, most single-module or RF test cards are often limited in their ability to simultaneously scan multiple devices under test

Also, given that current modular RF test equipment is designed to cover a wide frequency range, they suffer from complex and costly design

Therefore, the RF test process often suffers from both low throughput and slowing down the manufacturing and inspection process, but also suffers from high cost

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