Multichannel server on-off fatigue testing method based on single-chip microcomputer

A fatigue test, single chip technology, applied in the detection of faulty computer hardware, etc., can solve the problems of inability to test multiple servers at the same time, large size, etc., to achieve the effects of easy management and maintenance, high intelligence, and accurate time

Inactive Publication Date: 2013-12-18
LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The previous power-on / off fatigue test device was bulky and could not test multiple servers at the same time, and manual operation was required to configure the number of test power-on / off times and delay operation

Method used

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  • Multichannel server on-off fatigue testing method based on single-chip microcomputer
  • Multichannel server on-off fatigue testing method based on single-chip microcomputer

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0021] The method of the present invention is described in detail below with reference to the accompanying drawings.

[0022] Control unit, power conversion module, multi-channel power control module, LCD display module. The control unit includes a single-chip microcomputer, switch detection, POWER control, and operation buttons; the power conversion module is a 220V to 5V power supply; the multi-channel power supply control module includes a relay and a power output interface connected with the relay.

[0023] The fatigue test steps are as follows:

[0024] 1) Turn on the power, the system self-checks, and the display shows the self-test results;

[0025] 2) After the self-test is passed, the test method selection button flashes, prompting to select the test method;

[0026] 3) If manual test is selected, it will display whether the power is turned on and off for testing, if yes, set the power off switch, if not, design a counter and a delay test of the delay switch;

[00...

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PUM

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Abstract

The invention provides a multichannel server on-off fatigue testing method based on a single-chip microcomputer. The single-chip microcomputer is used as a control unit, and a large-power relay is controlled by low voltage so as to control on and off of server clusters. The system structurally comprises the control unit, a power supply conversion module, a multipath power supply control module and an LCD display module. Button, LCD display and sound-light alarm functions are adopted, operation is facilitated, and visualized display is achieved. An internal timer and counter of the single-chip microcomputer is used, so that time is accurate, error is small, and high automation level is achieved. Direct calling for testing is achieved by self testing schemes, and manual operation can be reduced. Counting and time delay can be set manually prior to testing, a testing instrument can be used for testing multiple servers simultaneously, number of testing equipment can be reduced, and management and maintenance are facilitated. By the internal power supply conversion module, mains supply is available, mounting and maintenance is facilitated, and use convenience is achieved.

Description

technical field [0001] The invention relates to the technical field of computer testing, in particular to a multi-channel server fatigue testing method based on a single-chip microcomputer. Background technique [0002] In the process of server development and testing, in order to check the stability of the machine, a large number of power-on and power-off tests and power-off and power-on tests are required. The previous power-on / off fatigue test device was bulky, unable to test multiple servers at the same time, and required manual operation to configure the number of test power-on / off times and delay operations. Contents of the invention [0003] The purpose of this invention is to provide a kind of multi-channel server power-off fatigue test method based on single-chip [0004] The invention provides a device that can pre-set the test scheme and simultaneously support multiple servers to perform power-on / off fatigue tests at the same time. [0005] The purpose of the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 郭圣彬史佩玉
Owner LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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