A near-infrared laser spot field of view parameter measurement device and measurement method

A laser parameter and laser spot technology, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of failure to realize automatic measurement, large measurement error, and no automatic test infrared laser spot.

Active Publication Date: 2016-10-05
XIAN TECH UNIV
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

In the prior art, there is an infrared laser spot measurement board, which mainly uses the panel as the substrate, and obtains the laser spot size by uniformly printing a layer of infrared quenching material on the surface of the panel in conjunction with lighting; in addition, there are laser-based The infrared spot measurement method of the shooting machine, etc., these measurement methods cannot realize automatic measurement, and because the edge of the laser spot is difficult to define, the measurement error is relatively large
[0003] For the invisible near-infrared laser spot measurement, since the exit spot cannot be observed by the human eye, it is difficult to obtain it by manual direct measurement, and there are relatively few spot measurement equipment for this type of laser, and most of them stay in theory and some simple engineering processing Computationally, there is no comprehensive automatic testing device for infrared laser spot in the prior art

Method used

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  • A near-infrared laser spot field of view parameter measurement device and measurement method
  • A near-infrared laser spot field of view parameter measurement device and measurement method
  • A near-infrared laser spot field of view parameter measurement device and measurement method

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Embodiment 1

[0040] Such as Figure 1-4 As shown, a near-infrared laser spot field parameter measurement device is shown, which includes a near-infrared laser parameter test bench 13, a computer 14, and a calibration grid board 16, wherein the computer 14 is equipped with processing and calculation software, the near-infrared laser The parameter test bench 13 includes a transmitting device capable of emitting near-infrared laser. The measuring device also includes a chassis base 20, the near-infrared laser parameter test bench 13 can be fixed on the chassis base 20, and the chassis base 20 is placed horizontally through at least three leveling bases 15 installed at its edges. On the ground or on the platform, each leveling base 15 can be used to adjust the height of the chassis base 20 to ensure that the entire near-infrared laser parameter test bench 13 is in a horizontal state. There are also two levels on the chassis base 20 Observe the water bubble to observe the horizontal state of th...

Embodiment 2

[0063] According to the operation steps of embodiment 1, if the pitch direction adjustment mechanism 2 and the concentric axis rotation adjustment mechanism 4 in the measurement specific step 5 are adjusted, the spot of the calibration laser 23 is located on the calibration grid plate 16, and the pitch direction rotation adjustment is recorded The visible laser sight 21 above the mechanism 2 is calibrating the new coordinate point of the grid plate see Figure 5 , Then ∠OFO 2 It is the angle β between the centerline of the near-infrared laser emission spot and the centerline of the main axis of the laser product. According to the coordinates O(x,y), O 0 (x 0 ,y 0 ) Get OO 2 And OO 0 Distance, press ΔOFO 2 , ΔO 2 O 0 F and ΔOO 0 F, combined with the pitch angle θ read by the thirteen-bit angle encoder 7, β can be calculated.

[0064] β = arccos OF 2 + O 2 F 2 - O 2 O 2 2 · OF · O 2 F

[0065] among them, O 2 F=L 0...

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Abstract

The invention relates to a near-infrared laser spot field-of-view parameter measurement device. The near-infrared laser spot field-of-view parameter measurement device comprises a near-infrared laser parameter test bench, a computer and a calibration grid plate, wherein the near-infrared laser parameter test bench comprises an emitting device capable of emitting near-infrared laser, the calibration grid plate is arranged at the position having a certain distance from the near-infrared laser parameter test bench, and the calibration grid plate is orthogonal to the laser emitted by the near-infrared laser parameter test bench. According to the near-infrared laser spot field-of-view parameter measurement device and method, border dotted lines of near-infrared laser spots are effectively found by rotating a holder to adjust the laser emitting direction and adopting image processing techniques, the sizes of the fields of view of various near-infrared laser spots can be measured effectively, the near-infrared laser spot field-of-view parameter measurement device has incomparable advantages which cannot be achieved by other equipment, is flexible in operation and simple, and visual processing results can be provided.

Description

Technical field [0001] The invention belongs to the technical field of laser testing, and specifically relates to a near-infrared laser spot field parameter measurement device and a measurement method. Background technique [0002] In the field of navigation and laser detection, the size of the laser spot restricts the performance of laser series weapons and ammunition. Under the same power condition, if the laser spot is too large, the field of view is too large, which means that the detection performance of this type of ammunition at the same distance is reduced If the laser spot is too small, that means the field of view is too small, the laser energy will converge, which will help improve the detection performance of the ammunition, and the detection distance will increase. The capture rate of detection, especially for near-infrared laser series products, therefore, the effective measurement of the size of the infrared laser spot can provide a reference basis for the developm...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00G01B11/26G01B11/28
Inventor 雷志勇李翰山高俊钗王泽民雷鸣李静闫克丁
Owner XIAN TECH UNIV
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