Computer testing system and method

A test system and test method technology, which is applied in electrical digital data processing, error detection/correction, detection of faulty computer hardware, etc.

Active Publication Date: 2014-05-21
湖北创达信息技术服务有限公司
View PDF1 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, if the computer cannot be turned on, it can only be concluded that the computer is abnormal, but it is impossible to know which part of the computer’s hardware has a problem that caused the computer to fail to turn on.
This brings great inconvenience to the computer test

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Computer testing system and method
  • Computer testing system and method
  • Computer testing system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] Please refer to figure 1 , the computer testing system of the present invention is used to transmit the test results of a plurality of hardware in a computer under test 10 to a monitoring device 60 through a network 70, so as to judge whether the functions of each hardware in the computer under test 10 are normal. A preferred embodiment of the computer testing system includes a BIOS (Basic Input Output System) 20, a PCH (Platform Controller Hub, platform control center) 30, and a BMC (Baseboard Management Controller, baseboard management controller) 40. A network chip 50 and some hardware to be tested. The PCH 30 is connected to the BMC 40 through its GPIO (General Purpose Input Output, general purpose input and output) pin. In this embodiment, the hardware to be tested includes a CPU (Central Processing Unit, central processing unit) 90 and a memory 80 . The GPIO pins include a first GPIO pin 500 and a second GPIO pin 502 . Of course, in other implementation manners...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a computer testing system which comprises a BIOS, a PCH and a BMC. The BIOS is used for outputting a control instruction for detecting whether the function of hardware to be tested is normal or not. The PCH is used for detecting the function of the corresponding hardware to be tested according to the received control instruction so as to judge whether the function of the hardware to be tested is normal or not, and outputting a corresponding status signal through a GPIO pin corresponding to the hardware to be tested. The BMC receives the status signal output by the PCH, obtains detection information of the function of the corresponding hardware according to the level of the received status signal output by the PCH and outputs the obtained testing information. According to the computer testing system, the hardware with the abnormal function can be accurately found when a computer test is started, and the test is facilitated. The invention further provides a computer testing method.

Description

technical field [0001] The invention relates to a computer testing system and method. Background technique [0002] In the process of computer development, certain reliability tests must be carried out, including a high and low temperature test. During the high and low temperature test, the computer must be placed in a constant temperature and humidity cabinet, so that the test environment becomes constant before testing, so as to judge whether the computer is normal. When the computer is placed in a constant temperature and humidity cabinet, if the computer cannot be turned on, it means that there is a problem with the computer. However, if the computer cannot be turned on, it can only be concluded that the computer is abnormal, but it is impossible to know which part of the computer's hardware has a problem and cause the computer to fail to turn on. This brings great inconvenience to the test of the computer. Contents of the invention [0003] In view of the above con...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2733G06F9/4401
Inventor 田波吴亢
Owner 湖北创达信息技术服务有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap