Contour meter and method for measuring the contour of a workpiece having tangentially adjoining contour geometries
A geometric shape and contour measurement technology, applied in the field of contour measuring instruments, can solve problems such as difficult to determine, difficult transition parts, etc., and achieve the effect of changing the minimum distance
Active Publication Date: 2014-05-28
CARL MAHR HLDG
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AI Technical Summary
Problems solved by technology
When measuring workpiece contours, it is only very difficult to determine transition points with sufficient accuracy
This in turn makes it difficult to determine whether the tangential transitions are produced with the desired accuracy during the manufacture of the workpiece
Method used
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Embodiment Construction
[0023] exist figure 1 A very simplified block diagram of the contour measuring device 10 is shown in . The profilometer 10 has a probing device 11 with a measuring probe 12 which is movable along a workpiece contour 13 to measure a workpiece contour 13 of a workpiece 14 . In this exemplary embodiment, the profilometer 10 is implemented as a profiler. The profilometer 10 has a linearly movable carriage 15 in the measuring direction R, on which a probe arm 16 is mounted pivotably about a pivot axis 17 . Starting from the pivot axis 17 , the probe arm 16 extends towards its first end 18 , at which the measuring probe 12 is arranged. A measured value receiver 20 , which detects the pivot position of the probe arm 16 about the pivot axis 17 , is associated with the probe arm 16 at a second end 19 of the probe arm opposite the first end 18 . The measured values of the measured value receiver 20 are transmitted to the control device 21 . The control device 21 is connected to an...
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The invention relates to a contour meter (10) and also to a method for measuring a workpiece contour (13). The workpiece contour (13) has a plurality of contour geometries (k). At least a first contour geometry (K1) and a second contour geometry (K2) adjoin one another tangentially at a first transition point (U1). Firstly, a multiplicity of measurement points (M) are recorded along the first contour geometry (K1) and the second contour geometry (K2). On the basis of some of the measurement points within the first contour geometry (K1), a first replacement element (G1) is determined and assigned to the first contour geometry (K1). Analogously to this, on the basis of some measurement points (M) of the second contour geometry (K2) a second geometry element (G2) assigned to the latter is determined. The size and / or the position of the second geometry element (G2) are calculated here under the boundary condition that the second replacement element (G2) adjoins the first replacement element (G1) tangentially. The tangential transition point between the two replacement elements (G1), (G2) forms the thus determined first transition point (U1). This method can be repeated iteratively with the aid of additional or other measurement points (M), until the position of the first transition point (U1) has been determined with sufficient accuracy.
Description
technical field [0001] The invention relates to a profilometer and a method for profiling. In this case, the contour of the workpiece is detected two-dimensionally or, alternatively, even three-dimensionally. The profilometer has a probing device for measuring points along the contour of a workpiece to be probing. The detection device can operate tactilely or contactlessly (for example optically). For example, a profiler (Tastschnittgeröt) can be used as a contour measuring device, which has a measuring probe (Messstaster) which moves along a predetermined path of the contour to be measured. A tracer is known, for example, from DE 10 2009 020 294 A1. Background technique [0002] Alternatively, the contour can also be detected with a profilometer having an image processing unit, as is known, for example, from document DE 10 2007 016 502 A1. In this case, the contour of the workpiece to be detected is recorded by a camera. The contour of the workpiece is then determined ...
Claims
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Patent Timeline
Login to View More IPC IPC(8): G01B21/04G06T17/10
CPCG01B5/20G01B21/04G01B21/20
Inventor H.韦伯
Owner CARL MAHR HLDG