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Contour measuring device and method for contour measurement of workpieces with contour geometries coupled tangentially to each other

A geometric shape and contour measurement technology, applied in the field of contour measuring instruments, can solve problems such as difficult to determine, difficult transition parts, etc., and achieve the effect of changing the minimum distance

Active Publication Date: 2017-05-10
CARL MAHR HLDG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When measuring workpiece contours, it is only very difficult to determine transition points with sufficient accuracy
This in turn makes it difficult to determine whether the tangential transitions are produced with the desired accuracy during the manufacture of the workpiece

Method used

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  • Contour measuring device and method for contour measurement of workpieces with contour geometries coupled tangentially to each other
  • Contour measuring device and method for contour measurement of workpieces with contour geometries coupled tangentially to each other
  • Contour measuring device and method for contour measurement of workpieces with contour geometries coupled tangentially to each other

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Experimental program
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Embodiment Construction

[0023] exist figure 1 A very simplified block diagram of the contour measuring device 10 is shown in . The profilometer 10 has a probing device 11 with a measuring probe 12 which is movable along a workpiece contour 13 to measure a workpiece contour 13 of a workpiece 14 . In this exemplary embodiment, the profilometer 10 is implemented as a profiler. The profilometer 10 has a linearly movable carriage 15 in the measuring direction R, on which a probe arm 16 is mounted pivotably about a pivot axis 17 . Starting from the pivot axis 17 , the probe arm 16 extends towards its first end 18 , at which the measuring probe 12 is arranged. A measured value receiver 20 , which detects the pivot position of the probe arm 16 about the pivot axis 17 , is associated with the probe arm 16 at a second end 19 of the probe arm opposite the first end 18 . The measured values ​​of the measured value receiver 20 are transmitted to the control device 21 . The control device 21 is connected to an...

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PUM

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Abstract

The invention relates to a profilometer (10) and a method for contour measurement of workpiece contours (13). The workpiece contour (13) has a plurality of contour geometries (k). At least one first contour geometry ( K1 ) and at least one second contour geometry ( K2 ) adjoin each other tangentially at a first transition point ( U1 ). First a number of measuring points (M) are recorded along the first contour geometry ( K1 ) and the second contour geometry ( K2 ). Based on a portion of the measurement points in the first contour geometry (K1), a first replacement element (G1) is determined and associated with the first contour geometry (K1). Analogously to this, a second geometric element (G2) associated with the second contour geometry (K2) is determined based on some measurement points (M) of the second contour geometry (K2). The calculation of the size and / or position of the second geometry element ( G2 ) takes place here under the boundary condition that the second substitution element ( G2 ) adjoins the first substitution element ( G1 ) tangentially. The tangential transition point between the two replacement elements ( G1 ), ( G2 ) forms the thus defined first transition point ( U1 ). The method can be repeated repeatedly with the aid of additional or other measuring points (M) until a sufficiently precise position determination of the first transition point ( U1 ) is achieved.

Description

technical field [0001] The invention relates to a profilometer and a method for profiling. In this case, the contour of the workpiece is detected two-dimensionally or, alternatively, even three-dimensionally. The profilometer has a probing device for measuring points along the contour of a workpiece to be probing. The detection device can operate tactilely or contactlessly (for example optically). For example, a profiler can be used as a profile measuring device, which has a measuring probe (Messstaster) that moves along a predetermined path of the profile to be measured. A tracer is known, for example, from DE 10 2009 020 294 A1. Background technique [0002] Alternatively, the contour can also be detected with a profilometer having an image processing unit, as is known, for example, from document DE 10 2007 016 502 A1. In this case, the contour of the workpiece to be detected is recorded by a camera. The contour of the workpiece is then determined by the image process...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B21/04G06T17/10
CPCG01B21/04G01B21/20G01B5/20
Inventor H.韦伯
Owner CARL MAHR HLDG