Analysis equipment for appearance defects of transparent substrates
A technology for substrates and equipment, applied in the field of analysis equipment, can solve problems such as difficult to detect defect classification
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[0072] figure 1 An apparatus 1 for analyzing a float glass ribbon 2 , ie an at least partially transparent substrate, which is continuously fed relative to the apparatus 1 , is illustrated for point defects. The device 1 comprises two lighting boxes 4 , 6 on both sides of the substrate 2 , one by transmission and the other by reflection. Each cabinet 4, 6 is simultaneously symmetrical to different zones 8A, 8B, 8C, 10A, 10B, 10C ( figure 2 with 4 ) is illuminated, the illuminated areas are all separated, and the substrate 2 is fed through the illuminated areas.
[0073] as in Figures 1 to 4 As illustrated in , these zones 8A, 8B, 8C, 10A, 10B, 10C correspond to subdivisions of the feed plane of the strip 2 .
[0074] The images formed by the two boxes 4 , 6 on the base plate 2 are acquired by a single matrix camera 12 . The camera is in figure 1 is arranged on the side of the illuminating box 4 through reflection (that is, on the side opposite to the illuminating box 6...
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