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Analysis equipment for appearance defects of transparent substrates

A technology for substrates and equipment, applied in the field of analysis equipment, can solve problems such as difficult to detect defect classification

Inactive Publication Date: 2018-05-08
SAINT GOBAIN VITRAGE SA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0033] However in the case of this system there is interference between each illumination which can make it difficult to detect and classify defects

Method used

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  • Analysis equipment for appearance defects of transparent substrates
  • Analysis equipment for appearance defects of transparent substrates
  • Analysis equipment for appearance defects of transparent substrates

Examples

Experimental program
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Embodiment Construction

[0072] figure 1 An apparatus 1 for analyzing a float glass ribbon 2 , ie an at least partially transparent substrate, which is continuously fed relative to the apparatus 1 , is illustrated for point defects. The device 1 comprises two lighting boxes 4 , 6 on both sides of the substrate 2 , one by transmission and the other by reflection. Each cabinet 4, 6 is simultaneously symmetrical to different zones 8A, 8B, 8C, 10A, 10B, 10C ( figure 2 with 4 ) is illuminated, the illuminated areas are all separated, and the substrate 2 is fed through the illuminated areas.

[0073] as in Figures 1 to 4 As illustrated in , these zones 8A, 8B, 8C, 10A, 10B, 10C correspond to subdivisions of the feed plane of the strip 2 .

[0074] The images formed by the two boxes 4 , 6 on the base plate 2 are acquired by a single matrix camera 12 . The camera is in figure 1 is arranged on the side of the illuminating box 4 through reflection (that is, on the side opposite to the illuminating box 6...

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Abstract

A device (1) for analyzing one or more at least partially transparent substrates (2) fed relative to the device (1), comprising: an illumination system (4, 6) able to operate in said or Each substrate ( 2 ) is intended to be fed through separate illumination zones to simultaneously produce different types of illumination; a matrix camera ( 12 ) capable of acquiring images transmitted and / or reflected by said one or more substrates ( 2 ) images of multiple rows of pixels and capable of simultaneously acquiring images of multiple groups of adjacent rows of pixels respectively corresponding to said separation zone; a manipulation unit (14) comprising a memory (15) on which A manipulation program is stored, said program being able to manipulate the camera (12) for synchronizing different acquisitions at the feed speed of said one or more substrates (2).

Description

technical field [0001] The invention relates to an analysis device which ensures the detection, measurement and identification of point-like defects at the surface or in a majority of a transparent (ie at least partially transparent) substrate. Background technique [0002] This device concerns all transparent products that exhibit point-like defects that alter the appearance of the product with respect to its user. In particular, the device is suitable for cosmetic defects present in glazing, regardless of its use. [0003] The detection of cosmetic defects, their measurement (ie estimation of their severity) and their identification play an important role in the quality control of glazing. [0004] The simple detection of these cosmetic defects, usually associated with the estimation of their size, is today no longer sufficient to ensure efficient quality control. The estimated defect severity levels according to different scales, according to the nature of the defect an...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/896G01N21/958
CPCG01N21/896G01N21/958H04N23/74
Inventor M.皮雄F.达韦纳A.塞雷恩
Owner SAINT GOBAIN VITRAGE SA