Method for detecting array substrates

Abstract

The invention discloses a method for detecting array substrates. The method comprises the steps that at preset temperature, the starting current value, corresponding to a standard grid starting voltage value, of each array substrate included in a test sample set is determined according to the pre-determined standard grid starting voltage value; whether TFTs in the test sample set reach a preset percent of pass or not is determined according to the determined starting current values and a pre-determined standard critical current value; if the TFTs in the test sample set do not reach the preset percent of pass, the design of the TFTs of the array substrates is improved, and a test sample set is remade to be detected till the TFTs in the improved test sample set reach the preset percent of pass. According to the method, it can be guaranteed that before a module is manufactured, the array substrate samples reach the preset percent of pass, then a display panel obtained after box jointing can be normally started at the preset temperature to display a picture, especially it is ensured that no problem occurs in the low-temperature starting process, and meanwhile later segment processes and module materials and equipment are saved.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a detection method of an array substrate. Background technique [0002] At present, liquid crystal display panels (Liquid Crystal Display, LCD) have the advantages of high picture quality, small size, light weight, etc., and are widely used in products such as mobile phones, notebook computers, television sets, and monitors. [0003] The TFT switch in the thin film transistor (ThinFilmTransistor, TFT) array substrate plays an extremely important role in the liquid crystal display, and the performance of the TFT switch directly affects the quality of the liquid crystal display. However, due to the increase in resolution of traditional LCD display products using liquid crystal technology, the threshold current level of TFT switches is getting lower and lower. The resulting problem is that at a certain temperature, especially in a low temperature environment, The display area of ​...

AI Technical Summary

Problems solved by technology

However, due to the increase in resolution of traditional LCD display products using liquid crystal technology, the threshold current level of TFT switches is getting lower and lower. The resulting problem is that at a certain temperature, especially in a low temperature environment, The display area of ​​the array substrate and the TFT switch of the gate drive circuit cannot be turned on normally, resulting in functional failure

The existing method of starting the test at a specific temperature is generally to make the display product into a module, put it into a test furnace at a specific temperature for more than several hours, and then turn on the light again to realize it. Those who cannot light up are regarded as product design Failed, but the product has gone through the substrate-to-module process, the cycle is very long, and there is not enough time for design revision after the problem is exposed

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