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Method for automatically detecting integrated circuit layout

An integrated circuit and automatic detection technology, which is applied in the fields of electrical digital data processing, instruments, calculations, etc., can solve the problem of prolonged design cycle, the impact of integrated circuit manufacturing and entering the market, and the automatic detection method cannot detect the "suspension" of the integrated circuit layout pins and other issues to achieve the effect of improving efficiency and shortening the design cycle

Active Publication Date: 2016-07-27
SPREADTRUM COMM (SHANGHAI) CO LTD
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  • Application Information

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Problems solved by technology

[0003] In the prior art, the automatic detection methods usually applied to the detection of the integrated circuit layout cannot detect the problem of "dangling" pins that may exist in the integrated circuit layout
Therefore, the entire design cycle will be seriously lengthened, which will have a serious impact on the manufacture of integrated circuits and their entry into the market.

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  • Method for automatically detecting integrated circuit layout
  • Method for automatically detecting integrated circuit layout
  • Method for automatically detecting integrated circuit layout

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Embodiment Construction

[0040] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0041] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.

[0042] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, but not as a limitation of the present invention.

[0043] In the prior art, the IC layout is usually exported and saved in a file format called Graphic Data Stream...

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Abstract

The invention discloses a method for automatically detecting an integrated circuit layout, belonging to the technical field of semiconductor data detection. The method comprises the following steps of: converting the layout into a GDS file including a path type and a polygon type; converting data of the path type into data of the polygon type; obtaining the largest connected domain set of each metal layer by calculation according to the data of the polygon type; finding out all metal layers associated with one preset lead; finding out the largest connected domain covering the preset lead from the metal layers associated with the preset lead; judging whether the largest connected domain associated with the preset lead in all the metal layers is in through hole connection or not; and outputting a judgement result that a suspension lead exists in the integrated circuit layout if the largest connected domain is not in through hole connection. The technical scheme has the benefits that: the problem that the suspension lead possibly included in the layout design cannot be detected in time through the existing detection means can be solved; the design period is shortened; and the design efficiency is increased.

Description

technical field [0001] The invention relates to the technical field of semiconductor data detection, in particular to an automatic detection method for an integrated circuit layout. Background technique [0002] In the prior art, a certain degree of automatic detection is usually performed on the layout of the integrated circuit to detect whether the layout design of the integrated circuit is consistent with the principle circuit Figure 1 Consistency, and whether it is consistent with the design rules of integrated circuits, etc. [0003] In the prior art, the automatic detection methods usually applied to the detection of the layout of the integrated circuit cannot detect the problem of "dangling" pins that may exist in the layout of the integrated circuit. Therefore, the entire design cycle will be seriously prolonged, which will have a serious impact on the manufacture of integrated circuits and their entry into the market. Contents of the invention [0004] According...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
Inventor 孙国清郑坚斌张爱林诸月平
Owner SPREADTRUM COMM (SHANGHAI) CO LTD