Microscopic three-dimensional measuring device and system
A technology of three-dimensional measurement and object measurement, applied in the field of three-dimensional measurement, can solve problems such as low precision, camera failure, incomplete three-dimensional surface data of objects, etc., achieve high sensitivity and accuracy, and improve the effect of pixel utilization
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0032] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0033] The main realization idea of the present invention is: a microscopic three-dimensional measuring device and system provided by the present invention, the light emitted by a single three-dimensional coordinate point in the object space is imaged after passing through the first lens group, the half mirror and the main lens, and the light continues to The forward propagation will be captured by the CCD behind multiple microlenses to obtain recorded images. Each microlens corresponds to an N*N macro pixel, and one object space point will eventually correspond to multiple recorded image points,...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com