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A Measuring System of Space Object Characteristics

A technology for measuring systems and space targets, which is applied in the field of target characteristic analysis and can solve problems such as inconvenience in obtaining characteristic data.

Active Publication Date: 2019-09-06
CHINA ACAD OF LAUNCH VEHICLE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The limitation of the current space object characteristic measurement technology is that it can only analyze the characteristics of material samples, it is not convenient to obtain comprehensive characteristic data, and it is not convenient to measure the reflection characteristics of three-dimensional small space objects or scaled models

Method used

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  • A Measuring System of Space Object Characteristics
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  • A Measuring System of Space Object Characteristics

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Embodiment Construction

[0033] Below in conjunction with accompanying drawing and specific example the present invention is described in further detail:

[0034] The invention provides a space object characteristic measurement system, such as figure 1As shown, the system includes a light source subsystem 1, a spectrometer subsystem 2, an arc slide rail 3, a sample loading platform 4, and an integrated control and data processing subsystem 5, which can be used to perform surface material property parameters on material samples. In addition, in order to take into account the measurement of the reflection characteristic data of the three-dimensional structure, a straight rail 7 and a CCD camera subsystem can also be added.

[0035] (1) System composition

[0036] Such as figure 1 As shown, the light source subsystem 1 and the spectrometer subsystem 2 are installed on the arc-shaped slide rail 3, and both the light source subsystem 1 and the spectrometer subsystem 2 are provided with motors. The motor...

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Abstract

The invention provides a space target characteristic measuring system, which comprises a light source sub system, a spectrograph sub system, an arc-shaped slide rail, a sample loading platform and a comprehensive control and data processing sub system, wherein the light source sub system and the spectrograph sub system are arranged on the arc-shaped slide rail; a motor is arranged in each of the light source sub system and the spectrograph sub system; the light source sub system and the spectrograph sub system can slide along the arc-shaped slide rail through the driving of the motors; the sample loading platform is positioned in the circle center position of the circular arc corresponding to the arc-shaped slide rail; a sample to be tested is fixed on the sample loading platform. The space target characteristic measuring system has the advantages that the light ray irradiation environment of outer space can be really simulated, so that the more accurate space target material characteristic parameters can be obtained; the space target characteristic study and space target imaging simulation data requirements are met.

Description

technical field [0001] The invention relates to the technical field of object characteristic analysis, in particular to a space object characteristic measurement system, which is used for measuring the characteristics of space object surface materials, and can measure the reflection characteristics of small space objects or scale models. Background technique [0002] The measurement of space target characteristics is a relatively basic work in the study of space target characteristics. The basic process of space target characteristics research and space target imaging simulation is to input the target surface material characteristic parameters, orbit parameters, target three-dimensional model, time information, coordinate transformation relationship, etc. into the simulation system, use the simulation calculation model based on ray tracing, and output the imaging Simulation results and target radiation characteristic information. Among them, only by accurately obtaining the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/25
Inventor 王欣胡超李航李洪波王立强李宇飞岳志勇王涛李元元魏向旺席福彪黄辉张帆单文杰吕淮北
Owner CHINA ACAD OF LAUNCH VEHICLE TECH