A Measuring System of Space Object Characteristics
A technology for measuring systems and space targets, which is applied in the field of target characteristic analysis and can solve problems such as inconvenience in obtaining characteristic data.
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[0033] Below in conjunction with accompanying drawing and specific example the present invention is described in further detail:
[0034] The invention provides a space object characteristic measurement system, such as figure 1As shown, the system includes a light source subsystem 1, a spectrometer subsystem 2, an arc slide rail 3, a sample loading platform 4, and an integrated control and data processing subsystem 5, which can be used to perform surface material property parameters on material samples. In addition, in order to take into account the measurement of the reflection characteristic data of the three-dimensional structure, a straight rail 7 and a CCD camera subsystem can also be added.
[0035] (1) System composition
[0036] Such as figure 1 As shown, the light source subsystem 1 and the spectrometer subsystem 2 are installed on the arc-shaped slide rail 3, and both the light source subsystem 1 and the spectrometer subsystem 2 are provided with motors. The motor...
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