Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Ultra-high precision oblique test platform

A test platform and precision technology, which is applied in the direction of measuring inclination, measuring device, mapping and navigation, etc., can solve the problem of difficult traceability of test technology, and achieve the effect of fast measurement speed, stable and reliable length, and convenient traceability.

Active Publication Date: 2017-07-28
INST OF EARTHQUAKE CHINA EARTHQUAKE ADMINISTRATION
View PDF5 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It is difficult to trace the source with the existing tilting platform test technology, and the detection and calibration of the instrument cannot be well completed

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Ultra-high precision oblique test platform
  • Ultra-high precision oblique test platform
  • Ultra-high precision oblique test platform

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0074] Below in conjunction with accompanying drawing and embodiment describe in detail:

[0075] 1. Overall

[0076] like figure 1 , 2 , the platform includes a PC controller 1, a first grating ruler measuring mechanism 2, a second grating ruler measuring mechanism 3, a first base 4, a second base 5, a first force balance device 6, a second force balance device 7, a second force balance device 3 grating ruler measuring mechanism 8, linear motor drive mechanism 9, platform panel 10, positioning base 11 and third force balance device 12;

[0077] Its location and connection relationship are:

[0078] The first base 4 and the second base 5 are arranged on the left side bottom of the platform panel 10, and the linear motor driving mechanism 9 is arranged on the right middle position below the platform panel 10, the first base 4, the second base 5 and the linear motor The driving mechanisms 9 are all arranged on the positioning base 11;

[0079] The first grating ruler measur...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an ultra-high precision oblique test platform and relates to the oblique test technology of a geoscientific instrument. The platform comprises a PC controller, a first grating ruler measuring mechanism, a second grating ruler measuring mechanism, a first base, a second base, a first force balancing device, a second force balancing device, a third grating ruler measuring mechanism, a linear motor drive mechanism, a platform panel, a positioning base and a third balancing device; the PC controller is respectively connected with the linear motor drive mechanism, the first grating ruler measuring mechanism, the second grating ruler measuring mechanism, the first base and the third grating ruler measuring mechanism, and not only is used for acquiring probe displacement signals from the first grating ruler measuring mechanism, the second grating ruler measuring mechanism and the third grating ruler measuring mechanism, but also is used for controlling the stepping motor motion of the linear motor drive mechanism, the first base and the second base. The ultra-high precision oblique test platform disclosed by the invention is applicable to oblique platform test and finishes the detection and calibration works of the instrument.

Description

technical field [0001] The invention relates to an inclination testing technology of geoscience instruments, in particular to an ultra-high-precision inclination testing platform. Background technique [0002] In the field of geophysical observation instruments, the tiltmeter can measure in one direction (1D) or in two directions (2D) simultaneously. According to the existing standards, the index of each direction is a maximum error of 0.003 arc seconds, a range of 2 arc seconds, and a discrimination of 0.0002 arc seconds. It is difficult to trace the source with the existing tilting platform testing technology, and the detection and calibration of the instrument cannot be well completed. [0003] The tilt instrument placed on the surface of the positioning base measures the response of the tilt displacement, velocity, and acceleration of the crustal surface; when the tilt instrument is placed on the tilt platform, and the tilt platform is placed on the surface of the posit...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01C9/06
CPCG01C9/06G01C2009/066
Inventor 李树德周云耀马鑫陈志遥吕永清张道忠齐军伟吴欢
Owner INST OF EARTHQUAKE CHINA EARTHQUAKE ADMINISTRATION
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com