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A Method for Registration of Optical and Synthetic Aperture Radar Images

A synthetic aperture radar and image registration technology, which is applied in image analysis, image enhancement, image data processing, etc., can solve the problems of poor applicability of optical image and SAR image registration, achieve registration rate improvement, high computing efficiency, The effect of low false alarm rate

Active Publication Date: 2019-08-02
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

[0005] In order to solve the problem of poor applicability of traditional methods for optical image and SAR image registration, the present invention proposes a new SAR image and optical image registration method based on line features and spatial consistency criterion (Spatial Consistency Matching, SCM)

Method used

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  • A Method for Registration of Optical and Synthetic Aperture Radar Images
  • A Method for Registration of Optical and Synthetic Aperture Radar Images
  • A Method for Registration of Optical and Synthetic Aperture Radar Images

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Embodiment

[0067] The following takes the optical image and SAR image data used in the Oberpfaffenhofen area of ​​Germany, the Albuquerque area of ​​the United States, and the Fort Jefferson area of ​​the United States as examples.

[0068] Attached figure 2 In order to use the linear feature map extracted by the LSD algorithm, the optical image and SAR image size of Oberpfaffenhofen in Germany are 800×800 and 1200×1300, respectively, and the optical image and SAR image size of Albuquerque in the United States are 399×459 and 500×457, respectively. The size of the optical image and SAR image in Fort Jefferson, USA are 570×440 and 531×399, respectively.

[0069] Attached Figure 4 Schematic diagram of the feature vector description process. Figure 4 (A) is a schematic diagram of the principal direction of the intersection of straight lines, Figure 4 (B) is a schematic diagram of the feature point description vector.

[0070] Attached Figure 5 Schematic diagram of the space constraint criteri...

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Abstract

The present invention belongs to the technical field of image registration, and in particular relates to a method for optical and synthetic aperture radar image registration. In the invention, the registration is based on the use of line characteristics and the space constraint criterion; through the extraction of the corresponding line characteristics and the solution to the corresponding intersection points, the point characteristics can be obtained indirectly. The intersection points are subjected to characteristic vector description, and the initially matched point pairs are screened through the space constraint criterion to finally complete the image registration. Compared with the commonly used registration method, the image point pair registration rate is raised to some extent, which facilitates the subsequent image fusion.

Description

Technical field [0001] The invention belongs to the technical field of image registration, and specifically relates to a method for optical and synthetic aperture radar image registration. Background technique [0002] Synthetic Aperture Radar (SAR) can provide high-resolution images throughout the day in all weather conditions. With the development of imaging technology, the methods for obtaining images of a certain area have become diverse, and there may be differences in imaging methods, shooting angles, and shooting times between these images. There is a certain degree of complementarity between different imaging methods. For example, SAR images can clearly reflect the detailed information of the target, and optical images can give people an intuitive understanding. In order to give full play to the advantages of different imaging methods, it is necessary to perform image fusion operations, and registration is a necessary step for image fusion. [0003] The purpose of image r...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/33
CPCG06T7/33G06T2207/10044
Inventor 崔宗勇王文洋曹宗杰皮亦鸣徐政五
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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