A sample table of a neutron diffraction stress spectrometer

Abstract

A sample table of a neutron diffraction stress spectrometer is provided. The sample table includes a sample mounting plate, a horizontal movement system controlling horizontal movement of the sample mounting plate, a vertical lifting and descending system controlling vertical movement of the sample mounting plate, and a rotation movement system controlling rotation of the sample mounting plate, a neutron diffraction stress spectrometer detector and a capturer. The sample mounting plate is disposed on the horizontal movement system. The lower part of the horizontal movement system is connected to the vertical lifting and descending system. The vertical lifting and descending system is connected to the rotation movement system. The bottom of the rotation movement system is connected to a floating supporting system. The rotation movement system includes a sample table autorotation part, a sample table supporting mechanism and a swing and connecting part. The sample table autorotation part is used for controlling the sample mounting plate to rotate around the center axis. The swing and connecting part is mounted to the sample table supporting mechanism through a circular-arc guide rail, and is used for connecting the detector and the capturer, and moves along the circular-arc guide rail.

Description

technical field [0001] The invention relates to the technical field of in-situ measurement of material structure and performance, and more specifically relates to a sample stage of a neutron diffraction stress spectrometer. Background technique [0002] The application of neutron scattering technology began in 1946. Researcher Shull of the Oak Ridge National Laboratory in the United States used a reactor-based neutron source to carry out neutron diffraction experiments for the first time, aiming to analyze the microscopic static structure inside the material. The neutron diffraction analysis technology is the same as The X-ray analysis method is similar, and the strain is calculated according to the displacement of the diffraction peak, and then converted into a stress result. Compared with the latter, neutrons have obvious advantages in penetration depth and distinguishing adjacent elements. It is generally believed in the industry that neutron diffraction analysis technolo...

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Problems solved by technology

[0008] The present invention provides a neutron diffraction stress spectrometer sample stage that overcomes the above-mentioned problems or at least partially solves the above-mentioned problems, and solves the problem of small motion stroke, low motion accuracy, and load-carrying capacity of samples in the neutron spectrometer sample stage in the prior art. Insufficient problem

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