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A Method of Event Sequence Fault Localization Supporting Constraints

An event sequence and fault location technology, applied in software testing/debugging, instrumentation, error detection/correction, etc., can solve the problem of not considering event sequence constraints to limit the impact of fault location, and achieve good fault location and overcome limitations.

Active Publication Date: 2021-06-25
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the problem that the traditional software event sequence fault location method does not consider the influence of constraints between event sequences on fault location

Method used

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  • A Method of Event Sequence Fault Localization Supporting Constraints
  • A Method of Event Sequence Fault Localization Supporting Constraints
  • A Method of Event Sequence Fault Localization Supporting Constraints

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Experimental program
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specific Embodiment approach 1

[0019] Specific implementation mode one: combine figure 1 This embodiment will be described. A constrained event sequence fault location method described in this embodiment, the specific steps of the method are:

[0020] Step 1. For a system under test with n events, initialize the set M1 formed by the correct event sequence test cases of the system under test to be an empty set, and initialize M2 formed by the wrong event sequence test cases of the system under test to be an empty set;

[0021] Define set N1 and set N2 as all t-dimensional adjacent event interactions covered by set M1 and set M2 respectively, define N=N2-N1, initialize the set N of the system to be tested as an empty set, and initialize all the minimal The set Γ composed of error event interactions is an empty set; set the maximum number of iterations to m;

[0022] Execute all event sequence test cases for testing the system under test, and generate a non-deterministic event interaction set N of the system...

specific Embodiment approach 2

[0032] Specific implementation mode two: this implementation mode further limits the constrained event sequence fault location method described in the first implementation mode, and the set Γ composed of all minimal error event interactions of the system under test is: if There is an event interaction S 0 , so that for any event sequence test case T in the system under test, it is necessary to satisfy That is, to satisfy the sequence of events test case T covers S 0 , must satisfy T to trigger the failure of the system under test, then it is called S 0 Interact for an error event of the system under test; if for the error event interaction S 0 , and any event interaction covered by it is not an error interaction, then it is called S 0 is a minimal error event interaction of the system under test; the set composed of all the minimal error event interactions of the system under test is denoted as set Γ.

specific Embodiment approach 3

[0033] Specific implementation mode three: this implementation mode further limits the constrained event sequence fault location method described in implementation mode two, and the specific process of generating a non-deterministic event interaction set N in step one of this implementation mode for:

[0034] For any event sequence test case of the system under test, if the event sequence test case passes the test, then the event sequence test case is a correct event sequence test case, and it is added to the set M1, and at the same time, the event sequence test case covers All event interactions are added to the set N1, if the event sequence test case fails the test, the event sequence test case is an error event sequence test case, and it is added to the set M2, and the event interaction covered by it is added to the set N2; then, The non-deterministic event interaction set composed of non-deterministic event interactions corresponding to all event sequence test cases of the...

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Abstract

A constraint-supported event sequence fault location method is used in the technical field of software testing. The invention solves the problem that the traditional software event sequence fault location method does not consider the influence of constraints between event sequences on fault location. The present invention obtains the non-deterministic event interaction set N of the system to be tested, calculates the error probability of each non-deterministic event interaction in the non-deterministic event interaction set N, and executes each event interaction in the set N in order of error probability from large to small , to determine the minimal error event interactions contained in the set Γ, and complete the event sequence fault location of the system under test; compared with the traditional event sequence fault location method, the fault location method of the present invention takes into account the constraints between event sequences Limiting the impact on fault location overcomes the limitations of the prior art. The invention can be applied in the technical field of software testing.

Description

technical field [0001] The invention belongs to the technical field of software testing, and in particular relates to a constraint-supported event sequence fault location method. Background technique [0002] After the software test finds a fault, the developer needs to find out the cause of the fault, that is, to locate the software fault, and then through the result of the fault location, the developer can go deep into the code to repair the fault. Therefore, software testing is of great importance to software development. Significance. [0003] In the process of software testing, it is usually assumed that each event sequence is independent of each other, but in actual software systems, there are generally constraints between event sequences, which will lead to the input order of some event sequences being meaningless or even invalid. However, traditional software event sequence fault location methods are either based on software internal structure information or softwar...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
CPCG06F11/3688
Inventor 魏长安孙超林连雷姜守达张雨
Owner HARBIN INST OF TECH