A Method for Determination of Secondary Electron Emission Characteristics on the Surface of Periodic Porous Media

Abstract

The invention relates to a method for det`ermining secondary electron emission characteristics of a periodic porous medium surface. Firstly, the material properties, surface periodic pore characteristics, radio frequency electromagnetic field, static charge accumulation field, static magnetic field and initial electronic information of a dielectric material are determined; then, each electron motion rail in the surface pore of the dielectric material and the motion time before the electron collides with the pore boundary are determined, and further, the collision angle and the collision energyof the electron and the pore boundary are obtained by calculation; finally, it is judged whether the electron is emitted from the por in combination with an electron motion rail equation and pore boundary condition according to secondary electron emission information of each electron being collided with the pore boundary, so as to obtain the secondary electron emission characteristics of the periodic porous dielectric material surface.

Description

technical field [0001] The invention relates to the field of surface material science and technology, in particular to a method for determining secondary electron emission characteristics on the surface of a periodic porous medium. Background technique [0002] The high microdischarge risk of high-power microwave components of spacecraft is a key factor affecting the long life and high reliability of spacecraft payloads, and it is also the most serious single-point failure link of satellites under high-power applications. For subsequent higher power requirements, the micro-discharge problem will become a key technology bottleneck and the biggest challenge for satellites such as high-power communications, navigation, and radar. [0003] The secondary electron emission coefficient on the material surface is the most critical factor in determining the microdischarge threshold of microwave components. According to the research results of the European Space Agency and its affili...

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Problems solved by technology

[0004] However, for dielectric microwave components or microwave components loaded with dielectric materials, there are more influencing factors, and the trajectory of electrons is more complicated. It is necessary to re-establish a new electron trajectory tracking algorithm and secondary electron emission characteristic analysis method

The main technical difficulty is that, firstly, the uniform linear motion of electrons in the pores of the metal surface becomes the variable-speed circular motion in the pores of the medium surface, and the calculation method is more complicated; secondly, the influence of the secondary electron emission characteristics of the medium surface on the micro discharge Furthermore, when the single secondary electron emission coefficient is less than 1, micro-discharge does not occur, and the boundary conditions for no micro-discharge need to be re-established according to the dynamic charge accumulation, and the solution process is more complicated.

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