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Method for determining secondary electron emission characteristics of periodic porous medium surface

A technology of secondary electron emission and porous medium, which is applied in the direction of material analysis using measurement of secondary emission, which can solve the problems of complex solution process, complex calculation method and many influencing factors.

Active Publication Date: 2018-12-21
XIAN INSTITUE OF SPACE RADIO TECH
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AI Technical Summary

Problems solved by technology

[0004] However, for dielectric microwave components or microwave components loaded with dielectric materials, there are more influencing factors, and the trajectory of electrons is more complicated. It is necessary to re-establish a new electron trajectory tracking algorithm and secondary electron emission characteristic analysis method
The main technical difficulty is that, firstly, the uniform linear motion of electrons in the pores of the metal surface becomes the variable-speed circular motion in the pores of the medium surface, and the calculation method is more complicated; secondly, the influence of the secondary electron emission characteristics of the medium surface on the micro discharge Furthermore, when the single secondary electron emission coefficient is less than 1, micro-discharge does not occur, and the boundary conditions for no micro-discharge need to be re-established according to the dynamic charge accumulation, and the solution process is more complicated.

Method used

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  • Method for determining secondary electron emission characteristics of periodic porous medium surface
  • Method for determining secondary electron emission characteristics of periodic porous medium surface
  • Method for determining secondary electron emission characteristics of periodic porous medium surface

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Embodiment 1

[0096] Embodiment 1: Determination of secondary electron emission characteristics on the surface of a periodic porous ferrite magnetic medium:

[0097] (1) Determine the material properties of the ferrite dielectric material, including the dielectric constant ε r =13 and the characteristic coefficient of secondary electron emission, wherein the characteristic coefficient of secondary electron emission includes the maximum secondary electron emission coefficient δ of the dielectric material at normal incidence max0 2.5, the maximum secondary electron emission coefficient δ of the dielectric material at normal incidence max0 Corresponding to the incident electron energy E max0 The minimum corresponding incident electron energy E is 300eV and the secondary electron emission coefficient of the dielectric material is 1 at normal incidence min is 30eV; determine the surface periodic pore characteristics, including the surface periodic pores are cylindrical pores distributed perpen...

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Abstract

The invention relates to a method for det`ermining secondary electron emission characteristics of a periodic porous medium surface. Firstly, the material properties, surface periodic pore characteristics, radio frequency electromagnetic field, static charge accumulation field, static magnetic field and initial electronic information of a dielectric material are determined; then, each electron motion rail in the surface pore of the dielectric material and the motion time before the electron collides with the pore boundary are determined, and further, the collision angle and the collision energyof the electron and the pore boundary are obtained by calculation; finally, it is judged whether the electron is emitted from the por in combination with an electron motion rail equation and pore boundary condition according to secondary electron emission information of each electron being collided with the pore boundary, so as to obtain the secondary electron emission characteristics of the periodic porous dielectric material surface.

Description

technical field [0001] The invention relates to the field of surface material science and technology, in particular to a method for determining secondary electron emission characteristics on the surface of a periodic porous medium. Background technique [0002] The high microdischarge risk of high-power microwave components of spacecraft is a key factor affecting the long life and high reliability of spacecraft payloads, and it is also the most serious single-point failure link of satellites under high-power applications. For subsequent higher power requirements, the micro-discharge problem will become a key technology bottleneck and the biggest challenge for satellites such as high-power communications, navigation, and radar. [0003] The secondary electron emission coefficient on the material surface is the most critical factor in determining the microdischarge threshold of microwave components. According to the research results of the European Space Agency and its affili...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/22
CPCG01N23/22
Inventor 李韵贺永宁王瑞杨晶王新波崔万照谢贵柏王丹
Owner XIAN INSTITUE OF SPACE RADIO TECH
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