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3D scanning system

一种三维扫描、光束的技术,应用在三维扫描系统领域,能够解决无法有效地使用、误差较大深度资讯、制造及使用不便等问题

Active Publication Date: 2020-10-20
QISDA OPTRONICS (SUZHOU) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, limited by the physical characteristics of internal components, although the scanning device can analyze and obtain effective depth information for objects within a specific depth of field, it can only obtain depth information with large errors for objects outside the specific depth of field. , and cannot be effectively used in subsequent applications
In the prior art, if the user wants to increase the depth range that can be effectively resolved, physical components of corresponding specifications must be used in the scanning device, such as special lens materials or special curvature shapes, resulting in high hardware costs and also Increase the volume of the scanning device, so it may cause inconvenience in manufacture and use

Method used

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Embodiment Construction

[0019] In order to have a further understanding of the purpose, structure, features, and functions of the present invention, the following detailed descriptions are given in conjunction with the embodiments.

[0020] figure 1 It is a schematic diagram of a three-dimensional scanning system 100 according to an embodiment of the present invention. The three-dimensional scanning system 100 includes a projection module 110 , an imaging module 120 and a light splitting module 130 .

[0021] The projection module 110 includes a light source 112 and a pattern generator 114 . The light source 112 can provide a first light beam B1 and a second light beam B2, wherein the first light beam B1 has a first wavelength, and the second light beam B2 has a second wavelength different from the first wavelength. The pattern generator 114 may receive the first light beam B1 to project the first pattern P1 and receive the second light beam B2 to project the second pattern P2.

[0022] In some em...

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Abstract

The invention provides a three -dimensional scanning system that contains projection modules, portrait modules and spaghetti modules.The projection module contains light sources and pattern generators.The light source provides the first light beam and the second light beam with different wavelengths.The pattern generator receives the first light beam to project the first pattern and receive the second light beam to project the second pattern.Take the image module to capture the first pattern and the second pattern projected in the image to be tested.The span module contains the first reflection surface and the second reflective surface.The first backbone reflection of the first light beam is to projected the first pattern to the object to be tested, and reflect the first light beam reflected by the tobe -of -measure reflection to the portrait module.The second -back reflection of the second light beam is to projected the second pattern to the object to be tested, and reflect the second light beam that is reflected by the measured object to the portrait module.

Description

technical field [0001] The present invention relates to a three-dimensional scanning system, in particular to a three-dimensional scanning system capable of improving the resolution depth range. Background technique [0002] Scanning devices can be used to create 3D models of objects and can be used in many different fields. For example, an animator can use a scanning device to create a three-dimensional model of an object to reduce manual drawing time. For example, a dental molder can use a scanning device to obtain a three-dimensional model of a patient's teeth to make dentures suitable for the patient. In the prior art, a scanning device can create a three-dimensional model of the object by emitting a projection beam with a fixed pattern to the object to be scanned, and according to the pattern presented by the light reflected by the object. Since the surface of the object may have features such as patterns or unevenness, the pattern presented by the light reflected by t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/2518G01B11/254G01B11/2531A61C9/006G02B27/141G02B27/1006H04N23/56
Inventor 丛志杰吴宗训林明坤
Owner QISDA OPTRONICS (SUZHOU) CO LTD