A system device for direct imaging of stimulated Brillouin scattering transient grating structure
A technology of stimulated Brillouin and grating structure, applied in the direction of reflectometer using stimulated backscattering, testing of machine/structural components, measuring device, etc., can solve the problem of few reports, unexplainable experimental results, microscopic mechanism and structural lack of detection methods etc.
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[0015] The implementation of the present invention will be described in detail below with reference to the drawings and examples, so as to fully understand and implement the implementation process of how to use technical means to solve technical problems and achieve technical effects in the present invention.
[0016] The specific embodiment of the present invention is such as figure 1 As shown, a system device for directly imaging a stimulated Brillouin scattering transient grating structure, including a horizontally polarized light emitting system, a λ / 4 wave plate 04, a mirror 05, and a stimulated Brillouin scattering transient grating forming system, optical energy meter 08 and optical parametric amplification imaging optical path system;
[0017] The horizontally polarized light emission system emits horizontally polarized light, and the horizontally polarized light rotates 45 degrees after passing through the λ / 4 wave plate, and then enters the stimulated Brillouin scatt...
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